A Practical Guide to Total Reflection X-ray Fluorescence discusses how a wide range of samples can be analyzed using Total Reflection X-ray Fluorescence (TXRF) to obtain meaningful, accurate results. Sections describe the theoretical aspects of methods and applications, emphasizing a practical approach, including advantages and limitations. The primary concept throughout the book is the chemical measurement process and how it applies to TXRF analysis, including aspects like samples, sample handling and quantification. Key case studies emphasizing the strength of the method are included. The book also explains the calibration of instrument and method, experimental parameters to apply, quantification procedures, and spectra evaluation. This book serves as a valuable resource for users and users-to-be in the field of elemental and trace analysis. All co-authors offer extensive experience in the field of TXRF and can guide users through the chemical measurement process of a specific field of application including what elements are most suitable, and what issues may occur.

• Covers sample preparation for various matrices to obtain meaningful and accurate data
• Explains how to optimize experimental parameters and provides guidance through the chemical measurement process
• Focuses on applications of TXRF in trace and surface analysis