Advanced Information-Measuring Technologies and Systems I: Studies in Systems, Decision and Control, cartea 439
Editat de Volodymyr Eremenko, Artur Zaporozhetsen Limba Engleză Hardback – 19 sep 2023
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Specificații
ISBN-13: 9783031407178
ISBN-10: 3031407172
Pagini: 277
Ilustrații: IX, 277 p. 234 illus., 82 illus. in color.
Dimensiuni: 155 x 235 mm
Greutate: 0.66 kg
Ediția:1st ed. 2024
Editura: Springer Nature Switzerland
Colecția Springer
Seria Studies in Systems, Decision and Control
Locul publicării:Cham, Switzerland
ISBN-10: 3031407172
Pagini: 277
Ilustrații: IX, 277 p. 234 illus., 82 illus. in color.
Dimensiuni: 155 x 235 mm
Greutate: 0.66 kg
Ediția:1st ed. 2024
Editura: Springer Nature Switzerland
Colecția Springer
Seria Studies in Systems, Decision and Control
Locul publicării:Cham, Switzerland
Cuprins
Preface.- Contents.- Metrological Support of Measurement Channels with Bridge Circuits.- Application of Exponential Splines in the Measurement and Control of Electric Circuit Parameters.- Improving of Methods of Impedance Parameters Units Reproduction and Measurement Accuracy Increasing for Ensuring Metrological Traceability.- Implementation of Information and Measurement Systems at the Base Specialized Internet Protocols.- Model of Information Signals Formation in the Diagnostics of Composite Products.- Theory and Practice of Ensuring the Validity in Testing Laboratories.- Methodology for Controlling Greenhouse Microclimate Parameters and Yield Forecast Using Neural Network Technologies.
Textul de pe ultima copertă
The book presents the main scientific directions and issues of research conducted in the Department of Information and Measurement Technologies at the National Technical University of Ukraine "Ihor Sikorskyi Kyiv Polytechnic Institute". The presented results cover almost all scientific directions related to information and measurement technologies—metrological support of measurement channels of information and measurement systems, methods of reproducing units of electric circuit parameters, development of specialized information and measurement systems, mathematical methods of processing measurement information, models of formation of information signals and fields, statistical diagnostic methods, information support of testing, and calibration laboratories.
Caracteristici
Focuses on metrological support of measurement channels of information and measurement systems Includes statistical diagnostic methods, information support of testing, and calibration laboratories Presents all scientific directions related to information and measurement technologies