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Advanced Metrology: Freeform Surfaces

Autor X. Jane Jiang, Paul J. Scott
en Limba Engleză Hardback – 7 apr 2020
Advanced Metrology: Freeform Surfaces provides the perfect guide for engineering designers and manufacturers interested in exploring the benefits of this technology. The inclusion of industrial case studies and examples will help readers to implement these techniques which are being developed across different industries as they offer improvements to the functional performance of products and reduce weight and cost.

  • Includes case studies in every chapter to help readers implement the techniques discussed
  • Provides unique advice from industry on hot subjects, including surface description and data processing
  • Features links to online content, including video, code and software
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Specificații

ISBN-13: 9780128218150
ISBN-10: 0128218150
Pagini: 374
Ilustrații: 120 illustrations (20 in full color)
Dimensiuni: 191 x 235 mm
Greutate: 0.86 kg
Editura: ELSEVIER SCIENCE

Cuprins

1. Introduction2. Fundaments for Freeform Surfaces3. Sampling for Freeform Surfaces4. Freeform Surface Fitting5. Linear and Non-linear Diffusion Filtration6. Morphological Filtration7. Wavelets Filtration8. Segmentation of Features on Freeform Surfaces9. Characterisation for Freeform Surfaces10. Characterisation of Freeform Structured Surfaces11. Freeform Surface Design and Metrology Platform12. Summary and Conclusion