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Advanced Statistical Methods for Reliability Analy sis

Autor WQ Meeker
en Limba Engleză Hardback – 7 dec 2026
This book improves Meeker and Escobar (1998, Wiley) not only in terms of organization and presentation, but also in extensions, modifications to the technical material, and advanced topic coverage (such as accelerated degradation and sensor, storage, and communications technology). It presents state-of-the-art, computer-based statistical methods for reliability data analysis, for test planning of industrial products, and for dynamic covariate information found on the Internet. It also improves long time established techniques as it demonstrates how to apply the new graphical, numerical, or simulation-based methods to a broad range of models encountered in reliability data analysis. Bayesian methods in solving practical problems (e.g. models involving random effects or censoring that arises in reliability studies) are now incorporated where appropriate; the computations are done with WinBUGS. Ample exercises that extend and strengthen the concepts in the book are included. The criterion for integrating material in the book is that the authors have in-hand or have seen real applications for the methodology. The book is specifically geared for either a one-semester course on advanced topics in reliability theory in either a statistics or engineering department at the second-year graduate level or for researchers who need access to new and modern methodologies. R functions and subroutines, along with an extensive list of data sets, are included on a massive web site that is meticulously maintained by the authors.
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Specificații

ISBN-13: 9781118115510
ISBN-10: 1118115511
Pagini: 512
Dimensiuni: 150 x 250 mm
Editura: Wiley
Locul publicării:Hoboken, United States

Public țintă

An essential resource for practitioners involved in product reliability and design decisions, Advanced Statistical Methods for Reliability Analysis is also an excellent textbook for on–the–job training courses and/or for university courses on applied reliability data analysis at the second–year graduate level.