Advances in the Crystallographic and Microstructural Analysis of Charge Density Wave Modulated Crystals: Physics and Chemistry of Materials with Low-Dimensional Structures, cartea 22
Editat de F. W. Boswell, J. Craig Bennetten Limba Engleză Paperback – 14 oct 2012
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Specificații
ISBN-13: 9789401059459
ISBN-10: 9401059454
Pagini: 276
Ilustrații: X, 261 p.
Dimensiuni: 160 x 240 x 14 mm
Greutate: 0.39 kg
Ediția:Softcover reprint of the original 1st ed. 1999
Editura: SPRINGER NETHERLANDS
Colecția Springer
Seria Physics and Chemistry of Materials with Low-Dimensional Structures
Locul publicării:Dordrecht, Netherlands
ISBN-10: 9401059454
Pagini: 276
Ilustrații: X, 261 p.
Dimensiuni: 160 x 240 x 14 mm
Greutate: 0.39 kg
Ediția:Softcover reprint of the original 1st ed. 1999
Editura: SPRINGER NETHERLANDS
Colecția Springer
Seria Physics and Chemistry of Materials with Low-Dimensional Structures
Locul publicării:Dordrecht, Netherlands
Public țintă
ResearchCuprins
Alternative Approaches to the Crystallographic Description of Charge Density Wave Modulated Systems.- 1. Introduction.- 2. The Symmetry Description of Modulated Structures.- 3. Applications.- 4. Concluding Remarks.- References.- X-ray Crystallographic Analysis of the Charge Density Wave Modulated Phases in the NbTe4 — TaTe4System.- 1. Introduction.- 2. Modulations.- 3. Phase Transitions.- 4. Structures.- References.- Charge Density Wave Phase Transitions and Microstructures in the TaTe4 — NbTe4 System.- 1. Introduction.- 2. Transmission Electron Microscopy of CDW Phase Transitions.- 3. CDW Phase Transitions in the Transition Metal Tetrachalcogenides TaTe4-NbTe4.- 4. Concluding Remarks.- References.- Transmission Electron Microscopy of CDW-Modulated Transition Metal Chalcogenides.- 1. Introduction.- 2. Selected Area Diffraction.- 3. Convergent Beam Diffraction.- 4. Satellite Dark Field Microscopy.- 5. High Resolution Electron Microscopy.- References.- Influence of Defects and Impurities on Charge Density Wave Systems.- 1. Introduction.- 2. Point Defects in CDW Materials.- 3. CDW in the Presence of Defects.- 4. Structural Variations in the Pinned CDW.- 5. Local Perturbations of the CDW.- 6. The Microstructural Aspect of the Pinning Strength.- 7. Conclusion.- References.- Analysis of Scanning Tunneling and Atomic Force Microscopy Images.- 1. Introduction.- 2. Simulations of STM and AFM Images.- 3. STM and AFM Images of Several Layered Compounds.- 4. Concluding Remarks.- References.- Elucidating Complex Charge Density Wave Structures in Low-Dimensional Materials by Scanning Tunneling Microscopy.- 1. Applications of Scanning Probe Microscopy.- 2. Background: Scanning Tunneling Microscopy.- 3. Charge Density Waves in Pure Materials.- 4. Charge Density Wave Pinning.- 5.New Directions: CDWs in Nanocrystals.- 6. Concluding Remarks.- References.- Index of Subjects.