Advances in X-Ray Analysis: Volume 35B
Editat de C.S. Barrett, John V. Gilfrich, Ting C. Huang, Ron Jenkins, G.J. McCarthy, Paul K. Predecki, R. Ryon, Deane K. Smithen Limba Engleză Paperback – 20 noi 2012
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Specificații
ISBN-13: 9781461365327
ISBN-10: 1461365325
Pagini: 648
Ilustrații: IV, 641 p.
Dimensiuni: 170 x 244 x 34 mm
Greutate: 1.02 kg
Ediția:Softcover reprint of the original 1st ed. 1992
Editura: Springer Us
Colecția Springer
Locul publicării:New York, NY, United States
ISBN-10: 1461365325
Pagini: 648
Ilustrații: IV, 641 p.
Dimensiuni: 170 x 244 x 34 mm
Greutate: 1.02 kg
Ediția:Softcover reprint of the original 1st ed. 1992
Editura: Springer Us
Colecția Springer
Locul publicării:New York, NY, United States
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Public țintă
ResearchCuprins
Whole Pattern Fitting, Rietveld Analysis, and Calculated Diffraction Patterns. Quantitative Phase Analysis by XRay Diffraction (XRD). Thin Film and Surface Characterization by XRD. Lattice Defects and XRay Topography. Texture Analysis by XRD. XRD Instrumentation, Techniques, and Reference Materials. Stress Determination by Diffraction Methods. XRD Profile Fitting, Crystallite Size and Strain Determination. XRD Applications: Detection Limits, Superconductors, Organics, Minerals. Mathematical Methods in XRay Spectrometry (XRS). Thin Film and Surface Characterization by XRS and XPS. Total Reflection XRS. XRS Techniques and Instrumentation. XRS Applications. XRay Imaging and Tomography. 161 articles. Index.