Atomic-Scale Analytical Tomography: Concepts and Implications: Advances in Microscopy and Microanalysis
Autor Thomas F Kelly, Brian P. Gorman, Simon P. Ringeren Limba Engleză Hardback – 23 mar 2022
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Specificații
ISBN-13: 9781107162501
ISBN-10: 1107162505
Pagini: 300
Dimensiuni: 175 x 250 x 18 mm
Greutate: 0.64 kg
Ediția:Nouă
Editura: Cambridge University Press
Colecția Cambridge University Press
Seria Advances in Microscopy and Microanalysis
Locul publicării:New York, United States
ISBN-10: 1107162505
Pagini: 300
Dimensiuni: 175 x 250 x 18 mm
Greutate: 0.64 kg
Ediția:Nouă
Editura: Cambridge University Press
Colecția Cambridge University Press
Seria Advances in Microscopy and Microanalysis
Locul publicării:New York, United States
Cuprins
Dedication; Acknowledgements; Foreword; Preface; 1. The need for ASAT; 2. History of atomic-scale microscopy; 3. Development of ASAT as a concept; 4. Has ASAT been achieved?; 5. How ASAT might be achieved; 6. Instrumentation for ASAT; 7. Practical ASAT; 8. Real space crystallography; 9. Experimental metrics for ASAT; 10. The nexus between ASAT and density functional theory; 11. Implications, applications, and the future of ASAT; Glossary of terms; Index.
Recenzii
'The quest for making better materials is ultimately linked to understanding the role of each individual atom in its place and its chemical environment. Three pioneers in the field guide us through a comprehensive scenario of how this can be achieved by combining the two most advanced atomic-scale characterization techniques: atom probe tomography and transmission electron microscopy.' Joachrim Mayer, RWTH Aachen University
Notă biografică
Descriere
The first comprehensive guide on Atomic-Scale Analytical Tomography, extending basics to the future implications for science and technology.