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Atomic-Scale Analytical Tomography: Concepts and Implications: Advances in Microscopy and Microanalysis

Autor Thomas F Kelly, Brian P. Gorman, Simon P. Ringer
en Limba Engleză Hardback – 23 mar 2022
A comprehensive guide on Atomic-Scale Analytical Tomography (ASAT) that discusses basic concepts and implications of the technique in areas such as material sciences, microscopy, engineering sciences and several interdisciplinary avenues. The title interrogates how to successfully achieve ASAT at the intersection of transmission electron microscopy and atom probe microscopy. This novel concept is capable of identifying individual atoms in large volumes as well as in 3D, with high spatial resolution. Written by leading experts from academia and industry, this book serves as a guide with real-world applications on cutting-edge research problems. An essential reading for researchers, engineers and practitioners interested in nanoscale characterisation, this book introduces the reader to a new direction for atomic-scale microscopy.
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Specificații

ISBN-13: 9781107162501
ISBN-10: 1107162505
Pagini: 300
Dimensiuni: 175 x 250 x 18 mm
Greutate: 0.64 kg
Ediția:Nouă
Editura: Cambridge University Press
Colecția Cambridge University Press
Seria Advances in Microscopy and Microanalysis

Locul publicării:New York, United States

Cuprins

Dedication; Acknowledgements; Foreword; Preface; 1. The need for ASAT; 2. History of atomic-scale microscopy; 3. Development of ASAT as a concept; 4. Has ASAT been achieved?; 5. How ASAT might be achieved; 6. Instrumentation for ASAT; 7. Practical ASAT; 8. Real space crystallography; 9. Experimental metrics for ASAT; 10. The nexus between ASAT and density functional theory; 11. Implications, applications, and the future of ASAT; Glossary of terms; Index.

Recenzii

'The quest for making better materials is ultimately linked to understanding the role of each individual atom in its place and its chemical environment. Three pioneers in the field guide us through a comprehensive scenario of how this can be achieved by combining the two most advanced atomic-scale characterization techniques: atom probe tomography and transmission electron microscopy.' Joachrim Mayer, RWTH Aachen University

Notă biografică


Descriere

The first comprehensive guide on Atomic-Scale Analytical Tomography, extending basics to the future implications for science and technology.