Cluster Secondary Ion Mass Spectrometry – Principles and Applications: Wiley Series on Mass Spectrometry
Autor CM Mahoneyen Limba Engleză Hardback – 27 iun 2013
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Specificații
ISBN-13: 9780470886052
ISBN-10: 0470886056
Pagini: 368
Dimensiuni: 162 x 234 x 23 mm
Greutate: 0.76 kg
Editura: Wiley
Seria Wiley Series on Mass Spectrometry
Locul publicării:Hoboken, United States
ISBN-10: 0470886056
Pagini: 368
Dimensiuni: 162 x 234 x 23 mm
Greutate: 0.76 kg
Editura: Wiley
Seria Wiley Series on Mass Spectrometry
Locul publicării:Hoboken, United States
Public țintă
This book is intended for analytical chemists, physicists, polymer chemists, and material scientists. Scientists and engineers in the fields of mass spectrometry, surface science, and polymer analysis and researchers with backgrounds in chemistry, physics, biology and materials science Researchers in the healthcare/pharmaceutical field as well as academic institutions and industrial clientsCuprins
Notă biografică
Christine M. Mahoney, PhD, is a recognized expert and leader in the field of Secondary Ion Mass Spectrometry (SIMS). Throughout her career, she has focused primarily on the application of SIMS to molecular targets, and has played a significant role in the development of cluster SIMS for polymer depth profiling applications. She received her PhD in analytical chemistry from SUNY Buffalo in 1993. She spent the following eight years at the National Institute of Standards and Technology (NIST), where much of her molecular depth profiling work was performed. Christine is currently employed as a senior research scientist at the Environmental Molecular Sciences Laboratory (EMSL) at Pacific Northwest National Laboratory (PNNL), where she continues to lead research in the field of SIMS.
Descriere
This book describes the importance of the emerging technique Cluster Secondary Ion Mass Spectrometry (SIMS), which is used for the analysis of a range of solid materials, including everything from organic and polymeric materials, to cells and semiconductors.