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Diffraction Physics: North-Holland Personal Library

Autor J. M. Cowley
en Limba Engleză Paperback – 4 dec 1995
The first edition of this highly successful book appeared in 1975 and evolved from lecture notes for classes in physical optics, diffraction physics and electron microscopy given to advanced undergraduate and graduate students. The book deals with electron diffraction and diffraction from disordered or imperfect crystals and employed an approach using the Fourier transform from the beginning instead of as an extension of a Fourier series treatment. This third revised edition is a considerably rewritten and updated version which now includes all important developments which have taken place in recent years.


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Specificații

ISBN-13: 9780444822185
ISBN-10: 0444822186
Pagini: 481
Ilustrații: 1
Dimensiuni: 156 x 234 x 26 mm
Greutate: 0.69 kg
Ediția:Rev
Editura: ELSEVIER SCIENCE
Seria North-Holland Personal Library


Cuprins

Sections: I. Physical Optics. 1. Fresnel and Fraunhofer diffraction. 2. Fourier transform and convolutions. 3. Imaging and diffraction.II. Kinematical Diffraction. 4. Radiations and their scattering by matter. 5. Scattering from assemblies of atoms. 6. Diffraction from crystals. 7. Diffraction from imperfect crystals.III. Dynamical Scattering. 8. Diffraction by perfect crystals. 9. Dynamical diffraction effects. 10. Extension to many beams. 11. Multi-slice approaches.IV. Applications to Selected Topics. 12. Diffuse scattering and absorption effects 13. Electron microscope imaging. 14. K-line patterns and channelling. 15. Application of dynamical effects in single crystals. 16. Mosaic crystals and polycrystalline materials. 17. Ordering of atoms in crystals. 18. Extended defects. 19. Diffraction from surfaces. References. Index.

Recenzii

"I have nothing but praise for this book. There is something in it for every physicist, not the least of which is the unifying process the author sets out to achieve."--Radiation Effects
"The publication of this book is an important event in the world of optics and microscopy."--Acta Crystallographica