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Electromigration and Electronic Device Degradation

Autor A. Christou
en Limba Engleză Hardback – 6 feb 1994
Addresses electromigration failure modes in electronics covering both theory and experiments. Reviews silicon and GaAs technologies. Various rate controlling details are summarized including an investigation of temperature dependence. Concludes with a discussion regarding current status and future plans for electromigration resistant advanced metallization systems for VLSI.
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Specificații

ISBN-13: 9780471584896
ISBN-10: 0471584894
Pagini: 344
Dimensiuni: 164 x 239 x 25 mm
Greutate: 0.69 kg
Editura: Wiley
Locul publicării:Hoboken, United States

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Descriere

This study reviews an important reliability issue for both silicon and GaAs technologies. It surveys the status of electromigration physics in microelectronics, and summarizes various rate controlling details.