Energy-Filtering Transmission Electron Microscopy: Springer Series in Optical Sciences, cartea 71
Editat de Ludwig Reimer P. W. Hawkes Contribuţii de C. Deininger, R.F. Egerton, F. Hofer, B. Jouffrey, D. Krahl, R.D. Leapman, J. Mayer, H. Rose, P. Schattschneider, J.C.H. Spenceen Limba Engleză Paperback – 13 noi 2013
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Specificații
ISBN-13: 9783662140550
ISBN-10: 3662140551
Pagini: 440
Ilustrații: XIII, 425 p. 157 illus.
Dimensiuni: 155 x 235 x 23 mm
Greutate: 0.61 kg
Ediția:Softcover reprint of the original 1st ed. 1995
Editura: Springer Berlin, Heidelberg
Colecția Springer
Seria Springer Series in Optical Sciences
Locul publicării:Berlin, Heidelberg, Germany
ISBN-10: 3662140551
Pagini: 440
Ilustrații: XIII, 425 p. 157 illus.
Dimensiuni: 155 x 235 x 23 mm
Greutate: 0.61 kg
Ediția:Softcover reprint of the original 1st ed. 1995
Editura: Springer Berlin, Heidelberg
Colecția Springer
Seria Springer Series in Optical Sciences
Locul publicării:Berlin, Heidelberg, Germany
Public țintă
ResearchCuprins
1. Introduction.- 2. Electron Optics of Imaging Energy Filters.- 3. Plasmons and Related Excitations.- 4. Inner-Shell Ionization.- 5. Quantitative Electron Energy-Loss Spectroscopy.- 6. Electron Spectroscopic Diffraction.- 7. Electron Spectroscopic Imaging.- 8. Energy-Filtered Reflection Electron Microscopy.
Recenzii
"This book gives an excellent introduction to the topic...and can be advised both as a text book for researchers new in this field as well as those looking for a basic reference to the topic." - Physicalia
Textul de pe ultima copertă
Energy-Filtering Transmission Electron Microscopy (EFTEM) presents a summary of the electron optics, the electron-specimen interactions, and the operation and contrast modes of this new field of analytical electron microscopy. The electron optics of filter lenses and the progress in the correction of aberrations are discussed in detail. An evaluation of our present knowledge of plasmon losses and inner-shell ionisations is of increasing interest for a quantitative application of EFTEM in materials and life sciences. This can be realized not only by filtering the elastically scattered electrons but mainly by imaging and analyzing with inelastically scattered electrons at different energy losses up to 2000 eV. The strength of EFTEM is the combination of the modes of electron energy-loss spectroscopy (EELS), Electron Spectroscopic Imaging (ESI) and Diffraction (ESD) and of energy filtering Reflection Electron Microscopy (REM) in one instrument.