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Focused Beam Methods

Autor John W. Schultz
en Limba Engleză Paperback
Determining the intrinsic microwave properties of materials is important for a variety of applications ranging from antenna and electronic circuit design to remote sensing to electromagnetic interference mitigation. A number of methods exist for characterizing intrinsic properties of materials at microwave frequencies, including transmission lines, resonant cavities, and impedance analysis. The use of free-space measurement methods has become commonplace among microwave material characterization laboratories due to its ease of use and reasonable accuracy. While some free-space facilities exist that can characterize down to 500 MHz, the method is most useful for characterizing materials from 2 GHz through millimeter waves. This book is designed to acquaint engineers and scientists with the theory and practice of using microwave focused beam systems for free-space characterization of materials.
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Specificații

ISBN-13: 9781480092853
ISBN-10: 1480092851
Pagini: 142
Dimensiuni: 156 x 234 x 9 mm
Greutate: 0.29 kg
Editura: CreateSpace Independent Publishing Platform