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Fringe Pattern Analysis for Optical Metrology – Theory, Algorithms, and Applications de M Servin

Fringe Pattern Analysis for Optical Metrology – Theory, Algorithms, and Applications

Autor M Servin
en Limba Engleză Hardback – iul 2014
The main objective of this book is to present the basic theoretical principles and practical applications for the classical interferometric techniques and the most advanced methods in the field of modern fringe pattern analysis applied to optical metrology.
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Specificații

ISBN-13: 9783527411528
ISBN-10: 3527411526
Pagini: 344
Ilustrații: 200 schwarz-weiße und 20 farbige Abbildungen
Dimensiuni: 174 x 249 x 22 mm
Greutate: 0.9 kg
Editura: Wiley Vch
Locul publicării:Weinheim, Germany

Public țintă

Optical Industry, Measurement and Control Engineers, Engineers for Measurement and Control, Students in Measurement and Control Engineering, Lecturers in Measurement and Control Engineering, Theoretical Physicists, Lecturers in Physics, Master′s Students in Physics, Ph.D. Students in Physics, Physicists in Industry, Experimental Physicists, Applied Physicists, Engineers, Electrical Engineers, Master′s Students in Engineering Sciences, Ph.D. Students in Engineering Sciences, Engineering Scientists, Engineering Scientists in Industry, Test Engineers, Lecturers in Mechanical Engineering, Computer Scientists, Company Libraries, Libraries at University Institutes, Libraries at Universities, University Institutes and Libraries, Mechanical Engineers