Frontiers in Statistical Quality Control 8: Frontiers in Statistical Quality Control, cartea 8
Editat de Hans-Joachim Lenz, Peter-Theodor Wilrichen Limba Engleză Paperback – 13 mar 2006
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Specificații
ISBN-13: 9783790816860
ISBN-10: 3790816868
Pagini: 372
Ilustrații: XIV, 351 p. 92 illus.
Dimensiuni: 155 x 235 x 24 mm
Greutate: 0.54 kg
Ediția:2006
Editura: Physica-Verlag HD
Colecția Physica
Seria Frontiers in Statistical Quality Control
Locul publicării:Heidelberg, Germany
ISBN-10: 3790816868
Pagini: 372
Ilustrații: XIV, 351 p. 92 illus.
Dimensiuni: 155 x 235 x 24 mm
Greutate: 0.54 kg
Ediția:2006
Editura: Physica-Verlag HD
Colecția Physica
Seria Frontiers in Statistical Quality Control
Locul publicării:Heidelberg, Germany
Public țintă
ResearchCuprins
General Aspects of SQC Methodology.- How Some ISO Standards Complicate Quality Improvement.- On-line Control.- Optimal Two-Stage Sequential Sampling Plans by Attributes.- Three-Class Sampling Plans: A Review with Applications.- CUSUM Control Schemes for Multivariate Time Series.- The Art of Evaluating Monitoring Schemes — How to Measure the Performance of Control Charts?.- Misleading Signals in Joint Schemes for ? and ?.- The Fréchet Control Charts.- Reconsidering Control Charts in Japan.- Control Charts for the Number of Children Injured in Traffic Accidents.- A New Perspective on the Fundamental Concept of Rational Subgroups.- Economic Advantages of CUSUM Control Charts for Variables.- Choice of Control Interval for Controlling Assembly Processes.- Generalization of the Run Rules for the Shewhart Control Charts.- Robust On-Line Turning Point Detection. The Influence of Turning Point Characteristics.- Specification Setting for Drugs in the Pharmaceutical Industry.- Monitoring a Sequencing Batch Reactor for the Treatment of Wastewater by a Combination of Multivariate Statistical Process Control and a Classification Technique.- Off-line Control.- Data Mining and Statistical Control - A Review and Some Links.- Optimal Process Calibration under Nonsymmetric Loss Function.- The Probability of the Occurrence of Negative Estimates in the Variance Components Estimation by Nested Precision Experiments.- Statistical Methods Applied to a Semiconductor Manufacturing Process.- An Overview of Composite Designs Run as Split-Plots.