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GOODNESS-OF-FIT Tests for Logistic Regression Models

Autor Xian-Jin Xie
en Limba Engleză Paperback – 25 oct 2013
When continuous predictors are present, classical Pearson and deviance goodness-of-fit tests to assess logistic model fit break down. We propose a new method for goodness-of-fit testing which uses a very general partitioning strategy (clustering) in the covariate space and is based on either a Pearson statistic or a score statistic. Properties of the proposed statistics are discussed. Simulation studies on many commonly encountered model scenarios are presented to compare the proposed tests to the existing tests. Applications of these different methods on a real clinical trial study are also performed to demonstrate the usefulness of the new method in practice and certain advantages over the widely used Hosmer-Lemeshow test. Discussions on extending this new method to other data situations, such as ordinal response regression models and marginal models for correlated binary data are also included. This method can also be extended to models for multinomial outcomes where generalized logit models are often used.
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Specificații

ISBN-13: 9783639074321
ISBN-10: 3639074327
Pagini: 172
Dimensiuni: 150 x 220 x 10 mm
Greutate: 0.24 kg
Editura: VDM Verlag Dr. Müller e.K.

Notă biografică

Dr. Xian-Jin Xie is an Assistant Professor and Director of Biostatistics Core at the Simmons Comprehensive Cancer Center, University of Texas Southwestern Medical Center. His research interests focus on biostatistics and bioinformatics methodologies and their application to collaborative biomedical and clinical research.