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Handbook of Semiconductor Manufacturing Technology

Editat de Yoshio Nishi, Robert Doering
en Limba Engleză Hardback – 9 iul 2007
Retaining the comprehensive and in-depth approach that cemented the bestselling first edition's place as a standard reference in the field, the Handbook of Semiconductor Manufacturing Technology, Second Edition features new and updated material that keeps it at the vanguard of today's most dynamic and rapidly growing field. Iconic experts Robert Doering and Yoshio Nishi have again assembled a team of the world's leading specialists in every area of semiconductor manufacturing to provide the most reliable, authoritative, and industry-leading information available.

Stay Current with the Latest Technologies
In addition to updates to nearly every existing chapter, this edition features five entirely new contributions on…
  • Silicon-on-insulator (SOI) materials and devices
  • Supercritical CO2 in semiconductor cleaning
  • Low-κ dielectrics
  • Atomic-layer deposition
  • Damascene copper electroplating
  • Effects of terrestrial radiation on integrated circuits (ICs)

    Reflecting rapid progress in many areas, several chapters were heavily revised and updated, and in some cases, rewritten to reflect rapid advances in such areas as interconnect technologies, gate dielectrics, photomask fabrication, IC packaging, and 300 mm wafer fabrication.

    While no book can be up-to-the-minute with the advances in the semiconductor field, the Handbook of Semiconductor Manufacturing Technology keeps the most important data, methods, tools, and techniques close at hand.
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    Specificații

    ISBN-13: 9781574446753
    ISBN-10: 1574446754
    Pagini: 1720
    Ilustrații: 1051 b/w images, 227 tables and 179 halftones
    Dimensiuni: 178 x 254 x 68 mm
    Greutate: 2.57 kg
    Ediția:Revizuită
    Editura: CRC Press
    Colecția CRC Press
    Locul publicării:Boca Raton, United States

    Public țintă

    Professional

    Cuprins

    Introduction to Semiconductor Devices. Overview of Interconnect-Copper and Low-κ Integration. Silicon Materials. SOI Materials and Devices. Surface Preparation. Supercritical Carbon Dioxide in Semiconductor Cleaning. Ion Implantation. Dopant Diffusion. Oxidation and Gate Dielectrics. Silicides. Rapid Thermal Processing. Low-κ Dielectrics. Chemical Vapor Deposition. Atomic Layer Deposition. Physical Vapor Deposition. Damascene Copper Electroplating. Chemical-Mechanical Polishing. Optical Lithography. Photoresist Materials and Processing. Photomask Fabrication. Plasma Etch. Equipment Reliability. Overview of Process Control. In-Line Metrology. In-Situ Metrology. Yield Modeling. Yield Management. Electrical, Physical, and Chemical Characterization. Failure Analysis. Reliability Physics. Effects of Terrestrial Radiation on Integrated Circuits. Integrated-Circuit Packaging. 300 mm Wafer Fab Logistics and Automated Material Handling Systems. Factory Modeling. Economics of Semiconductor Manufacturing. Appendix A: Physical Constants. Appendix B: Units Conversion. Appendix C: Standards Commonly Used in Semiconductor Manufacturing. Appendix D: Acronyms. Index.

    Descriere

    The second edition of this standard-setting handbook provides an up-to-date reference to the individual processes, equipment, and materials of semiconductor manufacturing technologies. Edited by renowned experts, this book provides graphs, tables, and formulas for easy access to information as well as extensive references for further study. This edition features new and updated chapters on silicon materials, SOI materials and devices, surface preparation, ion implantation, dopant diffusion, in-line metrology, yield modeling, photomask fabrication, failure analysis, damascene copper electroplating, rapid thermal processing, interlevel dielectrics, plasma etch, atomic layer deposition, and more.