Independent Component Analysis of Edge Information for Face Recognition: SpringerBriefs in Applied Sciences and Technology
Autor Kailash Jagannath Karande, Sanjay Nilkanth Talbaren Limba Engleză Paperback – 25 iul 2013
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Specificații
ISBN-13: 9788132215110
ISBN-10: 8132215117
Pagini: 96
Ilustrații: XIII, 81 p. 47 illus.
Dimensiuni: 155 x 235 x 5 mm
Greutate: 0.15 kg
Ediția:2014
Editura: Springer India
Colecția Springer
Seriile SpringerBriefs in Applied Sciences and Technology, SpringerBriefs in Computational Intelligence
Locul publicării:New Delhi, India
ISBN-10: 8132215117
Pagini: 96
Ilustrații: XIII, 81 p. 47 illus.
Dimensiuni: 155 x 235 x 5 mm
Greutate: 0.15 kg
Ediția:2014
Editura: Springer India
Colecția Springer
Seriile SpringerBriefs in Applied Sciences and Technology, SpringerBriefs in Computational Intelligence
Locul publicării:New Delhi, India
Public țintă
ResearchCuprins
Canny Edge Detection for Face Recognition using ICA.- Laplacian of Gaussian (LOG) Edge Detection for Face Recognition using ICA.- Oriented Laplacian of Gaussian (OLOG) Edge Detection for Face Recognition using ICA.- Multiscale Wavelet based Edge Detection for Face Recognition using ICA.
Notă biografică
Prof. Kailash J. Karande is currently working as Principal at SPSPM S.K.N. Sinhgad College of Engineering, Pandharpur, India. Prof. Karande has 18 years of teaching experience. He has completed his PhD in Electronics and Telecommunication (Image Processing) from SRTM University, Nanded, India in 2011. He has also received Prestigious European Fellowship for one month training at Aalborg University, Denmark, on Project Based Learning. Prof. Karande has recently authored a book “Face Recognition using Independent Component Analysis” with LAP LAMBERT Academic Publishing GmbH. He has also published many articles in national and international peer-reviewed journals and conference proceedings. Prof. Karande is a member of the Editorial Board of two international journals – International Journal of Emerging Technologies and Applications in Engineering Technology and Sciences (IJ-ETA-ETS) and International Journal of Computer Applications in Engineering Technology and Sciences (IJ-CA-ETS).
Dr. Sanjay Talbar is serving as a Professor with Department of Electronics and Telecommunication Engineering in Shri Guru Gobind Singhji Institute of Engineering and Technology, Nanded, India. He has obtained his PhD from S.R.T. Marathwada University, Nanded, India in 2000. He has received the Young Scientist Award by URSI, Italy in 2003. He is a member of many prestigious committees in academic field of India. His research interests are Signal & Image Processing and Embedded Systems.
Dr. Sanjay Talbar is serving as a Professor with Department of Electronics and Telecommunication Engineering in Shri Guru Gobind Singhji Institute of Engineering and Technology, Nanded, India. He has obtained his PhD from S.R.T. Marathwada University, Nanded, India in 2000. He has received the Young Scientist Award by URSI, Italy in 2003. He is a member of many prestigious committees in academic field of India. His research interests are Signal & Image Processing and Embedded Systems.
Textul de pe ultima copertă
The book presents research work on face recognition using edge information as features for face recognition with ICA algorithms. The independent components are extracted from edge information. These independent components are used with classifiers to match the facial images for recognition purpose. In their study, authors have explored Canny and LOG edge detectors as standard edge detection methods. Oriented Laplacian of Gaussian (OLOG) method is explored to extract the edge information with different orientations of Laplacian pyramid. Multiscale wavelet model for edge detection is also proposed to extract edge information. The book provides insights for advance research work in the area of image processing and biometrics.
Caracteristici
Discusses novel approaches on face recognition using edge information with ICA algorithms Details different methods and models for edge detection Provides insights for advance research work in the area of image processing and biometrics