Integrated Circuit Design for Radiation Environments
Autor Stephen J. Gaul, Nicolaas van Vonno, Steven H. Voldman, Wesley H. Morrisen Limba Engleză Hardback – 25 dec 2019
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Specificații
ISBN-13: 9781119966340
ISBN-10: 1119966345
Pagini: 392
Dimensiuni: 176 x 243 x 27 mm
Greutate: 0.88 kg
Editura: Wiley
Locul publicării:Chichester, United Kingdom
ISBN-10: 1119966345
Pagini: 392
Dimensiuni: 176 x 243 x 27 mm
Greutate: 0.88 kg
Editura: Wiley
Locul publicării:Chichester, United Kingdom
Notă biografică
STEPHEN J. GAUL is a Senior Principal Engineer at Renesas Electronics Americas, Inc., Florida, USA. He has worked in the semiconductor/integrated circuit field for over 35 years and has authored many papers and over 35 patents, many specific to radiation-hard/radiation-tolerant techniques. NICOLAAS VAN VONNO is currently a Principal Engineer at Renesas Electronics Americas, Inc., Florida, USA, and has been an independent consultant in the radiation effects field. He has been Guest Editor, Session Chairman, and Short Course Chairman for the IEEE Nuclear and Space Radiation Effects Conference (NSREC). STEVEN H. VOLDMAN, Ph.D., is a Consultant on ESD and latchup, as well as invention and patenting. He is a Fellow of the Electrical and Electronics Engineers (IEEE) and author of over 10 books and 262 patents. WESLEY H. MORRIS is President of Silicon-X (Technology focus), hardening CMOS devices to radiation and extreme temperatures. His career experience includes development of RH CMOS devices with SOS (RCA) and SOI (Harris), the first to prove bulk CMOS devices can be made latchup immune to extreme SEE radiation and operate reliably at high temperatures (250C). Morris is an author/inventor with multiple papers and patents related to RH and HT topics.