Introduction to Scanning Transmission Electron Microscopy

Autor Dr Robert Keyse, Anthony J. Garratt-Reed, P.J. Goodhew, Prof Gordon Lorimer

en Limba Engleză Paperback – 15 iun 1997

STEM is a discipline of importance to a growing number of microscopists. This book is essential reading for undergraduates, postgraduates and researchers requiring an up-to-date and comprehensive introduction to this rapidly growing, state of the art technique.

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Specificații

ISBN-13: 9781859960660
ISBN-10: 1859960669
Pagini: 128
Dimensiuni: 156 x 234 x 7 mm
Greutate: 0.45 kg
Ediția:1
Editura: CRC Press
Colecția CRC Press

Recenzii

"This handbook, like the previously-published handbooks in the series, is a good one. It is informative and provides undergraduates, post-graduates and researchers requiring an up-to-date and comprehensive introduction into the state-of-the-art microscope

Cuprins

Why STEM? - STEM versus TEM; STEM Optics; The specimen; Imaging in the STEM; Diffraction in the STEM; Microanalysis in the STEM; Mapping in the STEM; Limits to STEM and advanced STEM; Glossary; Further reading; Index

Descriere

STEM is a discipline of importance to a growing number of microscopists

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