Microscope Photometry
Autor H. Pilleren Limba Engleză Paperback – 15 noi 2011
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Specificații
ISBN-13: 9783642665721
ISBN-10: 3642665721
Pagini: 268
Ilustrații: X, 254 p.
Dimensiuni: 170 x 244 x 14 mm
Greutate: 0.43 kg
Ediția:Softcover reprint of the original 1st ed. 1977
Editura: Springer Berlin, Heidelberg
Colecția Springer
Locul publicării:Berlin, Heidelberg, Germany
ISBN-10: 3642665721
Pagini: 268
Ilustrații: X, 254 p.
Dimensiuni: 170 x 244 x 14 mm
Greutate: 0.43 kg
Ediția:Softcover reprint of the original 1st ed. 1977
Editura: Springer Berlin, Heidelberg
Colecția Springer
Locul publicării:Berlin, Heidelberg, Germany
Public țintă
ResearchCuprins
1 General Introduction.- 2 Ray Paths in the Microscope.- 2.1 Introduction.- 2.2 Illumination Systems for Bright Field.- 2.3 Imaging Systems for Bright Field.- 2.4 Dark-Field Systems.- 2.5 Diaphragms.- 2.6 Instrumental Parameters.- 2.7 Definition of Geometrical Optical Terms in Alphabetical Order.- 3 Transfer of Light Energy in the Optical System.- 3.1 Introduction.- 3.2 Spectral Concentration of Radiance of the Lamp.- 3.3 Spectral Bandwidth.- 3.4 Optical Flux.- 3.5 Transmittance of the Optical System.- 3.6 Interaction of Light with the Stage Object.- 3.7 Relation Between Light Power and Photometric Measuring Values.- 3.8 Sensation of Brightness in the Observer.- 4 The Light Source and Its Power Supply.- 4.1 Introduction.- 4.2 Stabilised Electric Power Supply.- 4.3 Various Types of Lamps.- 4.4 The Collector.- 4.5 Light Modulators.- 5 Monochromatising Devices and Filters.- 5.1 Introduction.- 5.2 Characteristics of Monochromatising Devices.- 5.3 Monochromatic Interference Filters.- 5.4 Prism- and Grating-Monochromators.- 5.5 Filters Other Than Monochromatising.- 5.6 Polarising Devices.- 6 The Basic Microscope Assembly.- 6.1 Condensers.- 6.2 Reflectors for Reflected-Light Work.- 6.3 Types of Microscope Stage.- 6.4 Objectives.- 6.5 Oculars.- 6.6 Body Tubes and Tube Optics.- 7 The Photometer System.- 7.1 Photometer Heads.- 7.2 Photomultiplier Tubes.- 7.3 Electrical Conversion Modules.- 8 Adjustment of Equipment.- 8.1 Microscope Axis and Stage-Rotation Axis.- 8.2 Luminous-Field Diaphragm.- 8.3 Condenser-Aperture Diaphragm and the Luminous Surface of Lamps.- 8.4 Levelling of the Stage Object in Reflected Light.- 8.5 Crossing the Polars and Orienting the Cross-Wires.- 9 Procedures in Photometry with the Microscope.- 9.1 Principle of Measurements.- 9.2 Photometer Systems.- 9.3 Reference Materials.- 9.4 Measuring Procedures.- 9.5 Computation of Measuring Results.- 9.6 Automation in Measuring and Data Processing.- 10 Special Techniques in Microscope Photometry.- 10.1 Microscope Fluorometry.- 10.2 Photometric Determination of Optical-Path Differences.- 10.3 Diffuse Reflection from Surfaces.- 10.4 Techniques for Measuring Micro-Auto-radiographs.- 10.5 Micro-Densitometry.- 10.6 Determination of Basic Optical Constants with Interference-Layer Techniques.- 11 Special Adjustment for Photometry.- 11.1 Focusing of Objective.- 11.2 Levelling of Stage Object in Specularly Reflected Light.- 11.3 Control of Photometric Field and Luminous Field.- 11.4 Control of Angle of Incidence.- 11.5 Control of Spectral Bandwidth.- 11.6 Setting of Central Wavelength.- 12 Systematic Measuring Errors.- 12.1 Distinction Between Systematic and Statistical Errors.- 12.2 General Aspects of Systematic Errors.- 12.3 Instrumental Factors Affecting the Light Supply to the Photosensor.- 12.4 Stage-Object Factors Affecting the Light Supply to the Photosensor.- 13 Statistical Errors.- 13.1 Causes of Statistical Errors.- 13.2 Expressions and Terms in Error Statistics.- 13.3 Evaluation of Precision with a Limited Number of Tests.- 13.4 Comparison of Precision in Different Tests.- 13.5 Summation of Standard Deviations.- 14 Application of Microscope Photometry.- 14.1 Absorption Parameters Measured in Transmitted Light.- 14.2 Parameters Measured in Reflected Light.- 14.3 Microscope Fluorometry.- 14.4 Refraction Parameters Derived from Optical-Path Difference.- Appendix 1. Specification of a Light Wave.- 2. Quantities, Units and Symbols.- 3. Accumulation of Errors.- 4. Detectivity and the Effect of Statistical Spread.- 5. Systematic Errors Due to Increments in Measuring Values.- 6. Experimental Determination of Factors Involved in the Spectral Sensitivity of Measuring Equipment.- 7. Correlation Between Photometric Values and Phase Differences in Double-Beam Interference Microscopy.- 8. Theory of Interference-Layer Technique.- 9. Determination of Relative Difference in Refractive Index of Two Contiguous Media.- 10. Theory of Secondary Effect of Glare.- 11. Mathematical Derivation of the Distributional Error.- 12. Beam Splitting in an Inclined Glass Plate and the Effect of Parasitic Images.- 14. Determination of Angles Between the Microscope Axis and Rays Deflected at, or Traversing, the Stage Object.- References.