Multiple Diffraction of X-Rays in Crystals: Springer Series in Solid-State Sciences, cartea 50
Autor Shih-Lin In-Hangen Limba Engleză Paperback – 22 dec 2011
Din seria Springer Series in Solid-State Sciences
- 18% Preț: 1225.94 lei
- 18% Preț: 1017.62 lei
- 15% Preț: 532.05 lei
- Preț: 541.46 lei
- 18% Preț: 962.35 lei
- Preț: 385.84 lei
- 18% Preț: 1827.48 lei
- 15% Preț: 661.02 lei
- Preț: 389.88 lei
- 15% Preț: 639.59 lei
- 15% Preț: 635.15 lei
- 18% Preț: 896.21 lei
- 15% Preț: 647.92 lei
- 15% Preț: 651.34 lei
- 18% Preț: 890.23 lei
- 15% Preț: 640.55 lei
- 15% Preț: 649.54 lei
- 15% Preț: 645.60 lei
- 15% Preț: 644.30 lei
- 15% Preț: 653.79 lei
- 18% Preț: 956.69 lei
- 15% Preț: 637.59 lei
- 23% Preț: 1043.41 lei
- 15% Preț: 639.08 lei
- 15% Preț: 648.24 lei
- 15% Preț: 637.46 lei
- 15% Preț: 640.06 lei
- Preț: 391.40 lei
- Preț: 390.84 lei
- 15% Preț: 638.57 lei
- 18% Preț: 1006.06 lei
- 18% Preț: 730.79 lei
- 15% Preț: 640.37 lei
- 15% Preț: 643.65 lei
- 18% Preț: 1231.01 lei
- 18% Preț: 950.21 lei
- 15% Preț: 642.68 lei
- 15% Preț: 640.55 lei
- 18% Preț: 1229.10 lei
- 15% Preț: 643.48 lei
Preț: 389.49 lei
Nou
Puncte Express: 584
Preț estimativ în valută:
74.55€ • 77.53$ • 62.47£
74.55€ • 77.53$ • 62.47£
Carte tipărită la comandă
Livrare economică 13-27 martie
Preluare comenzi: 021 569.72.76
Specificații
ISBN-13: 9783642821684
ISBN-10: 3642821685
Pagini: 320
Ilustrații: XI, 300 p.
Dimensiuni: 155 x 235 x 17 mm
Greutate: 0.45 kg
Ediția:Softcover reprint of the original 1st ed. 1984
Editura: Springer Berlin, Heidelberg
Colecția Springer
Seria Springer Series in Solid-State Sciences
Locul publicării:Berlin, Heidelberg, Germany
ISBN-10: 3642821685
Pagini: 320
Ilustrații: XI, 300 p.
Dimensiuni: 155 x 235 x 17 mm
Greutate: 0.45 kg
Ediția:Softcover reprint of the original 1st ed. 1984
Editura: Springer Berlin, Heidelberg
Colecția Springer
Seria Springer Series in Solid-State Sciences
Locul publicării:Berlin, Heidelberg, Germany
Public țintă
ResearchCuprins
1. Introduction.- 2. Geometry, Peak Indexing, and Experimental Techniques.- 2.1 Geometry of Multiple Diffraction.- 2.2 Experimental Techniques for Obtaining Multiple Diffraction.- 2.3 Indexing Multiple Diffraction Patterns.- 2.4 Indexing Kossel Patterns.- 3. Kinematical Theory of Diffraction.- 3.1 Equation of Power Transfer for Multi-Beam Cases.- 3.2 Approximate Solutions to the Equation of Power Transfer.- 3.3 Integrated Intensity and the Lorentz-Polarization Factors.- 3.4 Path Lengths of X-Ray Beams in Crystals.- 3.5 Exact Solution to the Power-Transfer Equation.- 3.6 Iterative Calculation for Reflection Power.- 3.7 Dynamical Treatment for Kinematical Reflections.- 3.8 Diffraction in Multi-Layered Crystals.- 3.9 Peak Width, Beam Divergence, and Mosaic Spread.- 4. Dynamical Theory of X-Ray Diffraction.- 4.1 Fundamental Equation of Wavefields.- 4.2 Polarization of Wavefields.- 4.3 Dispersion Surface.- 4.4 Energy Flow.- 4.5 Modes of Wave Propagation.- 4.6 Absorption.- 4.7 Boundary Conditions.- 4.8 Excitation of Mode and Excitation of Beam.- 4.9 Intensity of Wavefield (Standing-Wave) in Crystal.- 4.10 Consideration of the Spherical-Wave Nature of the Incident X-Rays.- 5. Approximations, Numerical Computing, and Other Approaches.- 5.1 Two-Beam Approximation for Three-Beam Diffraction.- 5.2 Procedures for Numerical Computing.- 5.3 Quantum Mechanical Approach.- 5.4 N-Beam Diffraction in Other Types of Interaction.- 6. Case Studies.- 6.1 Bragg-Type Multiple Diffraction from Gallium Arsenide, Indium Arsenide and Indium Phosphide—Kinematical Interpretation.- 6.2 Three-Beam Borrmann Diffraction—Dynamical Calculation.- 6.3 Simultaneous Four-Beam Borrmann Diffraction.- 6.4 Three-Beam Bragg-Laue and Bragg-Bragg Diffraction.- 6.5 Four-Beam Bragg-Laue Diffraction.- 7.Applications.- 7.1 Experimental Determination of X-Ray Reflection Phases; Application to Crystal Structure Determination.- 7.2 Determination of Lattice Constants of Single Crystals.- 7.3 Determination of Lattice Mismatch in Thin Layered Materials.- 7.4 Multi-Beam X-Ray Topography.- 7.5 Multi-Beam X-Ray Interferometer.- 7.6 Monochromatization of X-Ray Beams.- 7.7 Plasma Diagnosis.- 7.8 Determination of Mosaic Spread of Crystals.- 7.9 Multi-Beam X-Ray Standing-Wave Excited Fluorescence Technique for Surface Studies—A Proposed Method.- 7.10 Possible Future Trend of Development.- References.