Neutron Transmutation Doping of Semiconductor Materials
Autor Robert D. Larrabeeen Limba Engleză Paperback – 21 ian 2012
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Specificații
ISBN-13: 9781461296751
ISBN-10: 1461296757
Pagini: 356
Ilustrații: XIV, 338 p. 100 illus.
Dimensiuni: 178 x 254 x 19 mm
Greutate: 0.62 kg
Ediția:1984
Editura: Springer Us
Colecția Springer
Locul publicării:New York, NY, United States
ISBN-10: 1461296757
Pagini: 356
Ilustrații: XIV, 338 p. 100 illus.
Dimensiuni: 178 x 254 x 19 mm
Greutate: 0.62 kg
Ediția:1984
Editura: Springer Us
Colecția Springer
Locul publicării:New York, NY, United States
Public țintă
ResearchCuprins
1: NonSilicon NTD Materials.- Neutron Transmutation Doping of p-Type Czochralski-Grown Gallium Arsenide.- NTD Germanium: A Novel Material for Low Temperature Bolometers.- Reliable Identification of Residual Donors in High Purity Epitaxial Gallium Arsenide by Transmutation Doping.- Spallation Neutron Damage in Group IV, III-V and II-VI Semiconductors at 5 K.- 2: Irradiation Technology.- Future Reactor Capacity for the Irradiation of Silicon.- An Automatic Controlled, Heavy Water Cooled Facility for Irradiation of Silicon Crystals in the DR 3 Reactor at Risø National Laboratory, Denmark.- Irradiation of Single Silicon Crystals with Diameters in the 3- to 5-Inch Range in French Reactors.- The Development of NTD Technology in the Institute of Atomic Energy.- Measurements of the Gamma Abundance of Silicon-31.- Experiences with the Norwegian Research Reactor JEEP II in Neutron Transmutation Doping.- 3: Practical Utilizaton of NTD Material.- The Development of the Market for Neutron Transmutation Doped Silicon.- Neutron Transmutation Doped Silicon for Power Semiconductor Devices.- Process Induced Recombination Centres in Neutron Transmutation Doped Silicon and Their Influence on High-Voltage Direct-Current Thyristors.- A Study of Float-Zoned NTD Silicon Grown in a Hydrogen Ambient.- Experience with Neutron Transmutation Doped Silicon in the Production of High Power Thyristors.- 4: Characterization of NTD Material.- Transient Current Spectroscopy of Neutron Irradiated Silicon.- Calibration of the Photoluminescence Technique for Determination of Phosphorus in Silicon by Neutron Transmutation Doping.- Swirls in Neutron-Transmutation Doped Float-Zoned Silicon.- Compensation Effects in N.T.D. Indium Doped Silicon.- Correlation of NTD-Silicon Rod, Slice Resistivity.- 5: NeutronDamage and Annealing.- A Detailed Annealing Study of NTD Silicon Utilizing Raman Scattering.- Annealing Study of NTD Silicon Doped with Boron.- Annealing Effects of NTD Silicon on High-Power Devices.- Study of Annealing Behavior and New Donor Formation in Neutron Transmutation Doped Silicon Grown in a Hydrogen Atmosphere.- Participants.