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New Trends and Potentialities of Tof-SIMS in Surface Studies de Jacek Grams

New Trends and Potentialities of Tof-SIMS in Surface Studies

Autor Jacek Grams
en Limba Engleză Hardback – 31 aug 2007
This book presents the latest trends and applications of time-of-flight secondary ion mass spectrometry (ToF-SIMS). It includes research and applications of the new primary ion guns. It also describes new possibilities of mass spectrometers and instrumentation development.
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Specificații

ISBN-13: 9781600216350
ISBN-10: 1600216358
Pagini: 273
Ilustrații: tables & charts
Dimensiuni: 187 x 262 x 23 mm
Greutate: 0.75 kg
Editura: Nova Science Publishers Inc

Cuprins

Preface; Introduction; ToF-SIMS Basics and Instrument Development; Biomaterials, Biomolecules, Biologic, Biomaterials, Biomolecules, Biological Systems and Applications in Medicine; Polymers; Investigations of other Organic Compounds; Materials Applied Materials Applied in Electronic Materials Applied in Electronic Industry; Environmental Chemistry; Inorganic Surfaces; Corrosion and Monitoring of Organic Coating Processes; Forensic Science; Catalysis; Investigations of Surface Contaminations; Other Applications; Index.