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Nondestructive Evaluation of Semiconductor Materials and Devices: NATO Science Series B:, cartea 46

Editat de J. Zemel
en Limba Engleză Paperback – 11 sep 2013
From September 19-29, a NATO Advanced Study Institute on Non­ destructive Evaluation of Semiconductor Materials and Devices was held at the Villa Tuscolano in Frascati, Italy. A total of 80 attendees and lecturers participated in the program which covered many of the important topics in this field. The subject matter was divided to emphasize the following different types of problems: electrical measurements; acoustic measurements; scanning techniques; optical methods; backscatter methods; x-ray observations; accele­ rated life tests. It would be difficult to give a full discussion of such an Institute without going through the major points of each speaker. Clearly this is the proper task of the eventual readers of these Proceedings. Instead, it would be preferable to stress some general issues. What came through very clearly is that the measurements of the basic scientists in materials and device phenomena are of sub­ stantial immediate concern to the device technologies and end users.
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Specificații

ISBN-13: 9781475713541
ISBN-10: 1475713541
Pagini: 796
Ilustrații: XI, 782 p.
Dimensiuni: 170 x 244 x 42 mm
Greutate: 1.24 kg
Ediția:Softcover reprint of the original 1st ed. 1979
Editura: Springer Us
Colecția Springer
Seria NATO Science Series B:

Locul publicării:New York, NY, United States

Public țintă

Research