Optical Admittance Loci Monitoring for Thin Film Deposition
Autor Cheng-Chung Lee, Kai Wu, Tzu-Ling Nien Limba Engleză Paperback – 10 mai 2012
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Specificații
ISBN-13: 9783659001987
ISBN-10: 3659001988
Pagini: 148
Dimensiuni: 152 x 229 x 9 mm
Greutate: 0.23 kg
Editura: LAP LAMBERT ACADEMIC PUBLISHING AG & CO KG
Colecția LAP Lambert Academic Publishing
ISBN-10: 3659001988
Pagini: 148
Dimensiuni: 152 x 229 x 9 mm
Greutate: 0.23 kg
Editura: LAP LAMBERT ACADEMIC PUBLISHING AG & CO KG
Colecția LAP Lambert Academic Publishing
Notă biografică
Cheng-Chung Lee received his Ph.D. in Optical Sciences Center, University of Arizona. He is currently Dean of College of Science, Director of Thin Film Technology Center, and a chair professor of National Central University. He is the President of Taiwan Photonics Society, Fellow of OSA and SPIE. His expertise is thin film optics and interferometry