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Optical Admittance Loci Monitoring for Thin Film Deposition

Autor Cheng-Chung Lee, Kai Wu, Tzu-Ling Ni
en Limba Engleză Paperback – 10 mai 2012
To deposit a thin film coating with the correct thickness and refractive index is very important for precision optics. There are several methods have been proposed to monitoring the thickness of each layer for a multilayer optical filter during the coating process. Among those methods, the optical monitoring is generally thought better than other methods to manufacture optical filters, because it has error compensations which cannot be provided in other monitor methods. For the manufacture of some delicate optical filters with the high defect rate, the optical monitor with higher monitoring precision and better error compensation ability is necessary. Several optical monitoring methods have been reviewed, and novel monitoring techniques have been introduced for precision optical coatings.
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Specificații

ISBN-13: 9783659001987
ISBN-10: 3659001988
Pagini: 148
Dimensiuni: 152 x 229 x 9 mm
Greutate: 0.23 kg
Editura: LAP LAMBERT ACADEMIC PUBLISHING AG & CO KG
Colecția LAP Lambert Academic Publishing

Notă biografică

Cheng-Chung Lee received his Ph.D. in Optical Sciences Center, University of Arizona. He is currently Dean of College of Science, Director of Thin Film Technology Center, and a chair professor of National Central University. He is the President of Taiwan Photonics Society, Fellow of OSA and SPIE. His expertise is thin film optics and interferometry