Cantitate/Preț
Produs

Optical Methods of Measurement: Wholefield Techniques, Second Edition: Optical Science and Engineering

Autor Rajpal Sirohi
en Limba Engleză Paperback – 14 iun 2017
Optical Methods of Measurement: Wholefield Techniques, Second Edition provides a comprehensive collection of wholefield optical measurement techniques for engineering applications. Along with the reorganization of contents, this edition includes a new chapter on optical interference, new material on nondiffracting and singular beams and their applications, and updated bibliography and additional reading sections.
The book explores the propagation of laser beams, metrological applications of phase-singular beams, various detectors such as CCD and CMOS devices, and recording materials. It also covers interference, diffraction, and digital fringe pattern measurement techniques, with special emphasis on phase measurement interferometry and algorithms. The remainder of the book focuses on theory, experimental arrangements, and applications of wholefield techniques. The author discusses digital hologram interferometry, digital speckle photography, digital speckle pattern interferometry, Talbot interferometry, and holophotoelasticity.
This updated book compiles the major wholefield methods of measurement in one volume. It provides a solid understanding of the techniques by describing the physics behind them. In addition, the examples given illustrate how the techniques solve measurement problems.
Citește tot Restrânge

Din seria Optical Science and Engineering

Preț: 45593 lei

Preț vechi: 59026 lei
-23% Nou

Puncte Express: 684

Preț estimativ în valută:
8726 9064$ 7248£

Carte tipărită la comandă

Livrare economică 01-15 februarie 25

Preluare comenzi: 021 569.72.76

Specificații

ISBN-13: 9781138115491
ISBN-10: 1138115495
Pagini: 316
Ilustrații: 128
Dimensiuni: 156 x 234 mm
Greutate: 0.45 kg
Ediția:2
Editura: CRC Press
Colecția CRC Press
Seria Optical Science and Engineering


Public țintă

Professional

Cuprins

Waves and Beams. Optical Interference. Diffraction. Phase-Evaluation Methods. Detectors and Recording Materials. Holographic Interferometry. Speckle Metrology. Photo-Elasticity. The Moiré Phenomenon. Index.

Notă biografică

Rajpal S. Sirohi is currently the vice chancellor of Amity University. Prior to this, he was the vice chancellor of Barkatullah University and director of the Indian Institute of Technology Delhi. The recipient of many international awards and author of more than 400 papers, Dr. Sirohi is involved with research concerning optical metrology, optical instrumentation, holography, and speckle phenomenon.

Descriere

This book provides a comprehensive collection of wholefield optical measurement techniques for engineering applications. After supplying the necessary background, it covers both the theory and practice of the four wholefield techniques. The author supplies simple and clear explanations about various techniques and explores applications that include measurement on small objects to very large objects. Along with the reorganization of contents, this edition includes a new chapter on optical interference, new material on nondiffracting and singular beams and their applications, and updated bibliography and additional reading sections.