Optics of Charged Particles
Autor Hermann Wollniken Limba Engleză Paperback – 27 oct 2021
The book discusses individual particle trajectories as well as particle beams in space and in phase-space, and it provides guidelines for the design of particle optical instruments. For experienced researchers, working in the field, it highlights the latest developments in new ion optical instruments and provides guidelines and examples for the design of new instruments for the transport of beams of charged particles and the mass/charge or energy/charge analyses of ions. Furthermore, it provides background knowledge required to accurately understand and analyze results, when developing ion-optical instruments.
By providing a comprehensive overview of the field of charged particle optics, this edition of the book supports all those working, directly or indirectly, with charged-particle research or the development of ion- and electron-analyzing instruments.
- Provides enhanced, clear descriptions, and derivations making complex aspects of the general motion of charged particles understandable as well as features of charged particle analyzing instruments
- Assists the reader in applying insights obtained from the principles of charged particle optics to the design of new transporting and mass- or energy-analyzing instruments for ions
- Discusses new applications and newly occurring issues, which have arisen since the first edition
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Specificații
ISBN-13: 9780128186527
ISBN-10: 0128186526
Pagini: 318
Ilustrații: Approx. 135 illustrations
Dimensiuni: 152 x 229 x 27 mm
Greutate: 0.43 kg
Ediția:2
Editura: ELSEVIER SCIENCE
ISBN-10: 0128186526
Pagini: 318
Ilustrații: Approx. 135 illustrations
Dimensiuni: 152 x 229 x 27 mm
Greutate: 0.43 kg
Ediția:2
Editura: ELSEVIER SCIENCE
Cuprins
1. Gaussian Optics and Transfer Matrices2. General Relations for the Motion of Charged Particles in Electromagnetic Fields3. Quadrupole Lenses4. Sector Fields5. Charged Particle Beams in Phase Space6. Particle Beams in Periodic Structures7. Fringing Fields8. Image Aberrations9. Design of Particle Spectrometers and Beam Guide Lines10. Time-of-Flight Mass Spectrographs