Oxide Reliability: A Summary of Silicon Oxide Wearout, Breakdown, and Reliability de D. J. Dumin

Oxide Reliability: A Summary of Silicon Oxide Wearout, Breakdown, and Reliability: Selected Topics in Electronics and Systems, cartea 23

Editat de D. J. Dumin, David J. Dumin

en Limba Engleză Hardback – 31 dec 2001

A summary of our knowledge of oxide reliability, featuring articles written by experts in the field. It should be useful to reliability engineers and manufacturing engineers, helping them to produce and characterize reliable oxides. It can also be used as an introduction for new engineers.

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Specificații

ISBN-13: 9789810248420
ISBN-10: 9810248423
Pagini: 280
Dimensiuni: 170 x 256 x 20 mm
Greutate: 0.63 kg
Editura: World Scientific Publishing Company
Seriile SELECTED TOPICS IN ELECTRONICS & SYSTEMS S., Selected Topics in Electronics and Systems