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Principles of Electron Optics, Volume 2: Applied Geometrical Optics

Autor Peter W. Hawkes, Erwin Kasper
en Limba Engleză Paperback – 13 dec 2017
Principles of Electron Optics: Applied Geometrical Optics, Second Edition gives detailed information about the many optical elements that use the theory presented in Volume 1: electrostatic and magnetic lenses, quadrupoles, cathode-lens-based instruments including the new ultrafast microscopes, low-energy-electron microscopes and photoemission electron microscopes and the mirrors found in their systems, Wien filters and deflectors. The chapter on aberration correction is largely new. The long section on electron guns describes recent theories and covers multi-column systems and carbon nanotube emitters. Monochromators are included in the section on curved-axis systems.
The lists of references include many articles that will enable the reader to go deeper into the subjects discussed in the text.
The book is intended for postgraduate students and teachers in physics and electron optics, as well as researchers and scientists in academia and industry working in the field of electron optics, electron and ion microscopy and nanolithography.


  • Offers a fully revised and expanded new edition based on the latest research developments in electron optics
  • Written by the top experts in the field
  • Covers every significant advance in electron optics since the subject originated
  • Contains exceptionally complete and carefully selected references and notes
  • Serves both as a reference and text
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Specificații

ISBN-13: 9780128133699
ISBN-10: 0128133694
Pagini: 766
Dimensiuni: 191 x 235 x 40 mm
Greutate: 1.64 kg
Ediția:2
Editura: ELSEVIER SCIENCE

Public țintă

Postgraduate students and teachers in physics and electron optics; researchers and scientists in academia and industry working in the field of electron optics, electron and ion microscopy, and nanolithography

Cuprins

PART VII – INSTRUMENTAL OPTICS
35. Electrostatic Lenses 
36. Magnetic Lenses 
37. Electron Mirrors, Low-energy-electron Microscopes and Photoemission Electron Microscopes, Cathode Lenses and Field-emisssion Microscopy 
38. The Wien Filter 
39. Quadrupole Lenses 
40. Deflection Systems 
PART VIII – ABERRATION CORRECTION AND BEAM INTENSITY DISTRIBUTION (CAUSTICS)
41. Aberration Correction 
42. Caustics and their Applications 
PART IX – ELECTRON GUNS
43. General Features of Electron Guns 
44. Theory of Electron Emission 
45. Pointed Cathodes without Space Charge 
46. Space Charge Effects 
47. Brightness 
48. Emittance 
49. Gun optics 
50. Complete Electron Guns 
PART X – SYSTEMS WITH A CURVED OPTIC AXIS
51. General Curvilinear Systems 
52. Magnetic Sector Fields 
53. Unified Theories of Ion Optical Systems