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Principles of Electron Optics, Volume 2: Applied Geometrical Optics

Autor Peter W. Hawkes, Erwin Kasper
en Limba Engleză Paperback – 12 dec 2017
Principles of Electron Optics: Applied Geometrical Optics, Second Edition gives detailed information about the many optical elements that use the theory presented in Volume 1: electrostatic and magnetic lenses, quadrupoles, cathode-lens-based instruments including the new ultrafast microscopes, low-energy-electron microscopes and photoemission electron microscopes and the mirrors found in their systems, Wien filters and deflectors. The chapter on aberration correction is largely new. The long section on electron guns describes recent theories and covers multi-column systems and carbon nanotube emitters. Monochromators are included in the section on curved-axis systems.
The lists of references include many articles that will enable the reader to go deeper into the subjects discussed in the text.
The book is intended for postgraduate students and teachers in physics and electron optics, as well as researchers and scientists in academia and industry working in the field of electron optics, electron and ion microscopy and nanolithography.


  • Offers a fully revised and expanded new edition based on the latest research developments in electron optics
  • Written by the top experts in the field
  • Covers every significant advance in electron optics since the subject originated
  • Contains exceptionally complete and carefully selected references and notes
  • Serves both as a reference and text
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Specificații

ISBN-13: 9780128133699
ISBN-10: 0128133694
Pagini: 766
Dimensiuni: 191 x 235 x 40 mm
Greutate: 1.64 kg
Ediția:2
Editura: ELSEVIER SCIENCE

Public țintă

Postgraduate students and teachers in physics and electron optics; researchers and scientists in academia and industry working in the field of electron optics, electron and ion microscopy, and nanolithography

Cuprins

PART VII – INSTRUMENTAL OPTICS 35. Electrostatic Lenses  36. Magnetic Lenses  37. Electron Mirrors, Low-energy-electron Microscopes and Photoemission Electron Microscopes, Cathode Lenses and Field-emisssion Microscopy  38. The Wien Filter  39. Quadrupole Lenses  40. Deflection Systems 
PART VIII – ABERRATION CORRECTION AND BEAM INTENSITY DISTRIBUTION (CAUSTICS) 41. Aberration Correction  42. Caustics and their Applications 
PART IX – ELECTRON GUNS 43. General Features of Electron Guns  44. Theory of Electron Emission  45. Pointed Cathodes without Space Charge  46. Space Charge Effects  47. Brightness  48. Emittance  49. Gun optics  50. Complete Electron Guns 
PART X – SYSTEMS WITH A CURVED OPTIC AXIS 51. General Curvilinear Systems  52. Magnetic Sector Fields  53. Unified Theories of Ion Optical Systems