Principles of Electron Optics, Volume 3: Fundamental Wave Optics
Autor Peter W. Hawkes, Erwin Kasperen Limba Engleză Paperback – 18 feb 2022
The study of such beams forms the subject of electron optics, which divides naturally into geometrical optics where effects due to wavelength are neglected, with wave optics considered.
- Includes authoritative coverage of the fundamental theory behind electron beams
- Describes the interaction of electrons with solids and the information that can be obtained from electron-beam techniques
- Addresses recent, relevant research topics, including new content on holography and interference, new modes of image formation, 3D reconstruction and aberration corrected imaging, simulation and measurement
Preț: 1136.25 lei
Preț vechi: 1486.29 lei
-24% Nou
217.45€ • 226.54$ • 180.80£
Carte tipărită la comandă
Livrare economică 03-17 februarie 25
Livrare express 03-09 ianuarie 25 pentru 131.13 lei
Specificații
ISBN-10: 0128189797
Pagini: 558
Ilustrații: Approx. 150 illustrations
Dimensiuni: 191 x 235 x 32 mm
Greutate: 0.95 kg
Ediția:2
Editura: ELSEVIER SCIENCE
Public țintă
materials scientists and engineers, electronic engineers, applied physicists, electron microscopistsCuprins
54. Introduction
Part XI – Wave Mechanics 55. The Schrödinger Equation 56. The Relativistic Wave Equation 57. The Eikonal Approximation 58. Paraxial Wave Optics 59. The General Theory of Electron Diffraction and Interference 60. Elementary Diffraction Patterns
Part XII, Electron Interference and Electron Holography 61. General Introduction 62. Interferometry 63. Holography
Part XIII, Theory of Image Formation 64. General Introduction 65. Fundamentals of Transfer Theory 66. The Theory of Bright-field Imaging. 67. Image Formation in the Scanning Transmission Electron Microscope 68. Statistical Parameter Estimation Theory
Part XIV – Electron–specimen Interactions 69. Electron Interactions in Thin Specimens
Part XV – Digital Image Processing 70. Introduction 71. Acquisition, Sampling and Coding 72. Enhancement 73. Linear Restoration 74. Nonlinear Restoration – the Phase Problem 75. Three-dimensional Reconstruction 76. Image Analysis 77. Microscope Parameter Measurement and Instrument Control
Part XVI – Coherence, Brightness and Spectral Functions 78. Coherence and the Brightness Functions 79. Wigner Optics
PART XVII – Vortex Studies, the Quantum Electron Microscope 80. Orbital Angular Momentum, Vortex Beams and the Quantum Electron Microscope
Descriere
Principles of Electron Optic: Volume Three: Wave Optics, discusses this essential topic in microscopy to help readers understand the propagation of electrons from the source to the specimen, and through the latter (and from it) to the image plane of the instrument. In addition, it also explains interference phenomena, notably holography, and informal coherence theory. This third volume accompanies volumes one and two that cover new content on holography and interference, improved and new modes of image formation, aberration corrected imaging, simulation, and measurement, 3D-reconstruction, and more.
The study of such beams forms the subject of electron optics, which divides naturally into geometrical optics where effects due to wavelength are neglected, with wave optics considered.
- Includes authoritative coverage of the fundamental theory behind electron beams
- Describes the interaction of electrons with solids and the information that can be obtained from electron-beam techniques
- Addresses recent, relevant research topics, including new content on holography and interference, new modes of image formation, 3D reconstruction and aberration corrected imaging, simulation and measurement