Realizing Complex System Design
Editat de Anthony P. Ambler, John W. Shepparden Limba Engleză Hardback – 6 feb 2025
In addition to traditional systems engineering topics of hardware/software design, testability, and manufacturability, there are wider issues to be contemplated: project planning; communication language (an issue for international teams); units of measure (imperial vs metric) used across members of the team; supply chains (pandemics, military action, natural disasters); legal issues based on place of production and sale; the ethics associated with target use; the threat of cyber-attack. This book is a first attempt to bring many of these issues together to highlight the complexities that need to be considered in modern system design. It is neither exhaustive nor comprehensive, but it gives pointers to the topics for the reader to follow up on in more detail.
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Specificații
ISBN-13: 9781032036533
ISBN-10: 1032036532
Pagini: 504
Ilustrații: 350
Dimensiuni: 178 x 254 mm
Greutate: 1.12 kg
Ediția:1
Editura: CRC Press
Colecția CRC Press
Locul publicării:Boca Raton, United States
ISBN-10: 1032036532
Pagini: 504
Ilustrații: 350
Dimensiuni: 178 x 254 mm
Greutate: 1.12 kg
Ediția:1
Editura: CRC Press
Colecția CRC Press
Locul publicării:Boca Raton, United States
Public țintă
GeneralCuprins
"1: Introduction. Part 1: Properties of Effective and Reliable Design 2. Reliability. 3. Availability. 4. Testability. 5. Maintainability. 6. Diagnosability/Prognosability. 7. Fault Tolerant and Reconfigurable Design. 8. Design Reuse. Part 2: Project Management.9. Proposal Engineering. 10. Project Planning. 11. Performance-Based Logistics. 12. Collaboration. 13. Cultural Impact. 14. Intellectual Property Management. Part 3: Requirements Analysis. 15. Systems Engineering Vee. 16: Requirements Types – Design and Test. 17. System Decomposition. 18. Test-Driven Development. Part 4: Engineering Economics. 19. Time Value of Money. 20. Production Management. 21.Test Economics. 22. Logistics and Supply Chain Management. 23. Warranties and Product Liability"
Notă biografică
Anthony P. Ambler is a Fellow of the IEEE, elected ‘For contributions to economics of testing complex digital devices and systems’. His research interests are in test economics, system test and diagnosis. He received his B.Sc., M.Sc., and Ph.D. from the University of Manchester Institute of Science and Technology. He was appointed to a Chair in Test Technology at Brunel University (UK), and then moved to the USA. He became Chairman of Electrical & Computer Engineering at the University of Texas at Austin, then Dean of Engineering & Computing at the University of South Carolina, and recently as Dean of Technology at the University of Houston. In addition to his research work, he created the MS degree in Engineering Management at UT Austin. He has acted as Chair of the Organizing Committee of the European Design and Test Conference, General Chair and Program Chair of IEEE International Test Conference and of IEEE International Conference on Computer Design. He has created a number of Workshops including on Test Economics, System Test and Diagnosis, and Production Test Automation.
John W. Sheppard is a Norm Asbjornson College of Engineering Distinguished Professor in the Gianforte School of Computing at Montana State University His research interests include fault diagnosis/prognosis of complex systems, model-based and Bayesian reasoning, explainable and ethical artificial intelligence, and distributed population-based algorithms. He is a Fellow of the IEEE, elected “for contributions to system-level diagnosis and prognosis.” He received his BS in computer science from Southern Methodist University and his MS and PhD in computer science from Johns Hopkins University. Before entering academia full-time, he was a member of industry for 20 years where his prior position was as a research fellow at ARINC Incorporated. He has been a long-time leader in the IEEE Standards Association, chairing several working groups focused on publishing standards related to complex system test and diagnosis. Previously, he also served as the “designated representative” from the IEEE Computer Society to the IEEE Standards Coordinating Committee 20 on Test and Diagnosis for Electronic Systems.
John W. Sheppard is a Norm Asbjornson College of Engineering Distinguished Professor in the Gianforte School of Computing at Montana State University His research interests include fault diagnosis/prognosis of complex systems, model-based and Bayesian reasoning, explainable and ethical artificial intelligence, and distributed population-based algorithms. He is a Fellow of the IEEE, elected “for contributions to system-level diagnosis and prognosis.” He received his BS in computer science from Southern Methodist University and his MS and PhD in computer science from Johns Hopkins University. Before entering academia full-time, he was a member of industry for 20 years where his prior position was as a research fellow at ARINC Incorporated. He has been a long-time leader in the IEEE Standards Association, chairing several working groups focused on publishing standards related to complex system test and diagnosis. Previously, he also served as the “designated representative” from the IEEE Computer Society to the IEEE Standards Coordinating Committee 20 on Test and Diagnosis for Electronic Systems.
Descriere
The creation of complex integrated systems is, in itself, complex. It requires immense planning, a large team of people with diverse backgrounds, based in dispersed geographical locations (and countries) supposedly working to a coordinated schedule and cost.