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Scan Statistics: Methods and Applications: Statistics for Industry and Technology

Editat de Joseph Glaz, Vladimir Pozdnyakov, Sylvan Wallenstein
en Limba Engleză Hardback – 28 mai 2009
Scan statistics is currently one of the most active and important areas of research in applied probability and statistics, having applications to a wide variety of fields: archaeology, astronomy, bioinformatics, biosurveillance, molecular biology, genetics, computer science, electrical engineering, geography, material sciences, physics, reconnaissance, reliability and quality control, telecommunication, and epidemiology.
Filling a gap in the literature, this self-contained volume brings together a collection of selected chapters illustrating the depth and diversity of theory, methods and applications in the area of scan statistics. The chapters are written by leading experts in the field of scan statistics. Key features include many current results and new directions for future research; challenging theoretical methodological research problems; presentation accessible to both statisticians and scientists from other disciplines where scan statistics are employed; emphasis on real-world applications to areas such as bioinformatics and biosurveillance; and extensive references to research articles, books, and relevant computer software.
Scan Statistics is an excellent reference for graduate students and researchers in applied probability and statistics, as well as for scientists in biology, computer science, pharmaceutical science, medicine, geography, quality control, communications, and epidemiology. The work may also be used as a textbook for a graduate-level seminar on scan statistics.
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Specificații

ISBN-13: 9780817647483
ISBN-10: 0817647481
Pagini: 394
Ilustrații: XXVIII, 394 p. 40 illus.
Dimensiuni: 178 x 254 x 24 mm
Greutate: 0.95 kg
Ediția:2009
Editura: Birkhäuser Boston
Colecția Birkhäuser
Seria Statistics for Industry and Technology

Locul publicării:Boston, MA, United States

Public țintă

Research

Cuprins

Joseph Naus: Father of the Scan Statistic.- Precedence-Type Tests for the Comparison of Treatments with a Control.- Extreme Value Results for Scan Statistics.- Boundary Crossing Probability Computationsin the Analysis of Scan Statistics.- Approximations for Two-Dimensional Variable Window Scan Statistics.- Applications of Spatial Scan Statistics: A Review.- Extensions of the Scan Statistic for the Detection and Inference of SpatialClusters.- 1-Dependent Stationary Sequences and Applications to Scan Statistics.- Scan Statistics in Genome-Wide Scan for Complex Trait Loci.- On Probabilities for Complex Switching Rules in Sampling Inspection.- Bayesian Network Scan Statistics for Multivariate Pattern Detection.- ULS Scan Statistic for Hotspot Detection with Continuous Gamma Response.- False Discovery Control for Scan Clustering.- Martingale Methods for Patterns and Scan Statistics.- How Can Pattern Statistics Be Useful for DNA Motif Discovery?.- Occurrence of Patterns and Motifs in Random Strings.- Detection of Disease Clustering.

Recenzii

From the reviews:
“The area of scan statistics has developed rapidly in recent years. … provided excellent overviews of the area. … There are many papers of interest here for the readers of Technometrics. … This reviewer enjoyed thumbing through the pages of this volume and feels that the editors hope that it will serve as a valuable reference and source for researchers in applied probability and statistics and in many other areas of science and technology is well justified.” (H. N. Nagaraja, Technometrics, Vol. 53 (1), February, 2011)

Textul de pe ultima copertă

Scan statistics is currently one of the most active and important areas of research in applied probability and statistics, having applications to a wide variety of fields: archaeology, astronomy, bioinformatics, biosurveillance, molecular biology, genetics, computer science, electrical engineering, geography, material sciences, physics, reconnaissance, reliability and quality control, telecommunication, and epidemiology.
Filling a gap in the literature, this self-contained volume brings together a collection of selected chapters illustrating the depth and diversity of theory, methods and applications in the area of scan statistics.
Key features:

* Chapters are written by leading experts in the field.
* Features many current results and highlights new directions for future research.
* Includes challenging theoretical methodological research problems.
* Presentation is accessible to statisticians as well as to scientists from other disciplines where scan statistics are employed.
* Real-world applications to areas such as bioinformatics and biosurveillance are emphasized.
* Contains extensive references to research articles, books, and relevant computer software.
 
Scan Statistics is an excellent reference for graduate students and researchers in applied probability and statistics, as well as for scientists in biology, computer science, pharmaceutical science, medicine, geography, quality control, communications, and epidemiology. The work may also be used as a textbook for a graduate-level seminar on scan statistics.

Caracteristici

Presentation is accessible to statisticians as well as to scientists from other disciplines where scan statistics are employed Many current results and new directions for future research are featured Contains extensive references to research articles, books, and relevant computer software May be used as a textbook for a graduate-level seminar on scan statistics