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Scanning Transmission Electron Microscopy of Nanomaterials: Basics of Imaging and Analysis

Autor Nobuo Tanaka
en Limba Engleză Hardback – 5 iun 2014
The basics, present status and future prospects of high-resolution scanning transmission electron microscopy (STEM) are described in the form of a textbook for advanced undergraduates and graduate students. This volume covers recent achievements in the field of STEM obtained with advanced technologies such as spherical aberration correction, monochromator, high-sensitivity electron energy loss spectroscopy and the software of image mapping. The future prospects chapter also deals with z-slice imaging and confocal STEM for 3D analysis of nanostructured materials.
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Specificații

ISBN-13: 9781848167896
ISBN-10: 184816789X
Pagini: 616
Dimensiuni: 155 x 229 x 33 mm
Greutate: 1.04 kg
Ediția:New.
Editura: Imperial College Press