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Secondary Ion Mass Spectrometry SIMS V: Proceedings of the Fifth International Conference, Washington, DC, September 30 – October 4, 1985 de Alfred Benninghoven

Secondary Ion Mass Spectrometry SIMS V: Proceedings of the Fifth International Conference, Washington, DC, September 30 – October 4, 1985: Springer Series in Chemical Physics, cartea 44

Editat de Alfred Benninghoven, Richard J. Colton, David S. Simons, Helmut W. Werner
en Limba Engleză Paperback – 11 ian 2012

Din seria Springer Series in Chemical Physics

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Specificații

ISBN-13: 9783642827266
ISBN-10: 3642827268
Pagini: 592
Ilustrații: XXII, 564 p.
Dimensiuni: 155 x 235 x 31 mm
Greutate: 0.82 kg
Ediția:Softcover reprint of the original 1st ed. 1986
Editura: Springer Berlin, Heidelberg
Colecția Springer
Seria Springer Series in Chemical Physics

Locul publicării:Berlin, Heidelberg, Germany

Public țintă

Research

Cuprins

I Retrospective.- II Fundamentals.- III Symposium: Detection of Sputtered Neutrals.- IV Detection Limits and Quantification.- V Instrumentation.- VI Techniques Closely Related to SIMS.- VII Combined Techniques and Surface Studies.- VIII Ion Microscopy and Image Analysis.- IX Depth Profiling and Semiconductor Applications.- X Metallurgical Applications.- XI Biological Applications.- XII Geological Applications.- XIII Symposium: Particle-Induced Emission from Organics.- XIV Organic Applications Including Fast Atom Bombardment Mass Spectrometry.- Index of Contributors.