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SEM Microcharacterization of Semiconductors de D. B. Holt

SEM Microcharacterization of Semiconductors: Techniques of Physics, cartea 12

Editat de D. B. Holt, D. C. Joy
en Limba Engleză Hardback – 15 noi 1989
Applications of SEM techniques of microcharacterization have proliferated to cover every type of material and virtually every branch of science and technology. This book emphasizes the fundamental physical principles. The first section deals with the foundation of microcharacterization in electron beam instruments and the second deals with the interpretation of the information obtained in the main operating modes of a scanning electron microscope.
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Specificații

ISBN-13: 9780123538550
ISBN-10: 0123538556
Pagini: 452
Dimensiuni: 152 x 229 x 27 mm
Greutate: 0.82 kg
Editura: ELSEVIER SCIENCE
Seria Techniques of Physics

Public țintă

Condensed matter physicists, surface and materials scientists, electronic and optics engineers, and solid state chemists.

Cuprins

Foundations of Microcharacterization in Electron Beam Instruments: D.B. Holt, An Introduction to Multi-Mode Scanning Electron Microscopy. D. Newbury, Modeling Electron Beam Interactions in Semiconductors. D.C. Joy, Channeling Patterns. D.C. Joy, The Emissive Mode and X-ray Microanalysis. Quantitation and the Interpretation of Signals in the Individual Modes: S.M. Davidson, Voltage Contrast and Stroboscopy. D.B. Holt, The Conductive Mode. O. Breitenstein and J. Heydenreich, Scanning Deep Level Transient Spectroscopy. D.B. Holt and B.G. Yacobi, Cathodoluminescence Characterization of Semiconductors. P. Balk, The Electroacoustic Mode.