Statistical Modeling and Robust Inference for One-shot Devices
Autor Narayanaswamy Balakrishnan, Elena Castillaen Limba Engleză Paperback – apr 2025
- Offers an in-depth review of statistical methods for the testing and analysis of one-shot devices
- Includes numerous examples and case studies in which the proposed methods are applied
- Introduces detailed R codes in each chapter to help readers implement their own codes, use them in proposed examples, and in their own research on one-shot device testing data
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Specificații
ISBN-13: 9780443141539
ISBN-10: 0443141533
Pagini: 250
Dimensiuni: 152 x 229 mm
Editura: ELSEVIER SCIENCE
ISBN-10: 0443141533
Pagini: 250
Dimensiuni: 152 x 229 mm
Editura: ELSEVIER SCIENCE
Cuprins
1. Introduction 2. Preliminaries 3. Divergence Measures and their Application to One-shot Device Testing 4. Robust Inference under the Exponential Distribution 5. Robust Inference under the Gamma Distribution 6. Robust Inference under the Weibull Distribution 7. Robust Inference under the Lognormal distribution 8. Robust Inference under the Proportional Hazards Model 9. Robust Inference under the Exponential Distribution and Competing Risks 10. Robust Inference under the Weibull Distribution and Competing Risks 11. Robust Optimal Design of Accelerated Life Tests for One-Shot Device Testing 12. Conclusions and Future Directions