Cantitate/Preț
Produs

Statistical Modeling and Robust Inference for One-shot Devices

Autor Narayanaswamy Balakrishnan, Elena Castilla
en Limba Engleză Paperback – apr 2025
Statistical Modeling and Robust Interference for One-shot Devices offers a comprehensive investigation on robust techniques for one-shot devices under accelerated life tests. With numerous examples, case studies, and included R codes in each chapter, this book helps readers implement their own codes, use them in proposed examples, and conduct their own research on one-shot device testing data. Researchers, mathematicians, engineers, and students working on accelerated life testing data analysis and robust methodologies will surely find this to be a welcomed resource. The study of one-shot devices such as automobile airbags, fire extinguishers, and antigen tests is rapidly becoming an important problem in the area of reliability engineering. These devices, which get destroyed or must be rebuilt after use, are particular cases of extreme censoring, which makes the problem of estimating their reliability and lifetime challenging. As classical statistical and inferential methods do not consider the issue of robustness, this book is a welcomed addition to the conversation.


  • Offers an in-depth review of statistical methods for the testing and analysis of one-shot devices
  • Includes numerous examples and case studies in which the proposed methods are applied
  • Introduces detailed R codes in each chapter to help readers implement their own codes, use them in proposed examples, and in their own research on one-shot device testing data
Citește tot Restrânge

Preț: 74197 lei

Preț vechi: 92747 lei
-20% Nou

Puncte Express: 1113

Preț estimativ în valută:
14199 14890$ 11840£

Carte nepublicată încă

Doresc să fiu notificat când acest titlu va fi disponibil:

Preluare comenzi: 021 569.72.76

Specificații

ISBN-13: 9780443141539
ISBN-10: 0443141533
Pagini: 250
Dimensiuni: 152 x 229 mm
Editura: ELSEVIER SCIENCE

Cuprins

1. Introduction 2. Preliminaries 3. Divergence Measures and their Application to One-shot Device Testing 4. Robust Inference under the Exponential Distribution 5. Robust Inference under the Gamma Distribution 6. Robust Inference under the Weibull Distribution 7. Robust Inference under the Lognormal distribution 8. Robust Inference under the Proportional Hazards Model 9. Robust Inference under the Exponential Distribution and Competing Risks 10. Robust Inference under the Weibull Distribution and Competing Risks 11. Robust Optimal Design of Accelerated Life Tests for One-Shot Device Testing 12. Conclusions and Future Directions