Test and Diagnosis of Analogue, Mixed-Signal and RF Integrated Circuits: The System on Chip Approach de Yichuang Sun

Test and Diagnosis of Analogue, Mixed-Signal and RF Integrated Circuits: The System on Chip Approach: Circuits, Devices and Systems, cartea 19

Editat de Yichuang Sun

en Limba Engleză Paperback – 30 sep 2007

This book provides a comprehensive discussion of automatic testing, diagnosis and tuning of analogue, mixed-signal and RF integrated circuits, and systems in a single source. The book reports systematically the state of the arts and future research directions of those areas.

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Specificații

ISBN-13: 9780863417450
ISBN-10: 0863417450
Pagini: 416
Dimensiuni: 157 x 231 x 25 mm
Greutate: 0.61 kg
Ediția:New.
Editura: Institution of Engineering and Technology
Seriile Materials, Circuits and Devices, Circuits, Devices and Systems

Notă biografică

Yichuang Sun is Professor at the University of Hertfordshire, UK. His research interests are in analogue and mixed-signal circuits, RF and communication circuits, circuit testing and fault diagnosis, coding and signal detection, space-time and MIMO communications, wireless and mobile networks.