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Test and Measurement: Know It All: Newnes Know It All

Autor Jon S. Wilson, Stuart Ball, Creed Huddleston, Edward Ramsden, Dogan Ibrahim
en Limba Engleză Paperback – 3 noi 2008
The Newnes Know It All Series takes the best of what our authors have written to create hard-working desk references that will be an engineer's first port of call for key information, design techniques and rules of thumb. Guaranteed not to gather dust on a shelf!Field Application engineers need to master a wide area of topics to excel. The Test and Measurement Know It All covers every angle including Machine Vision and Inspection, Communications Testing, Compliance Testing, along with Automotive, Aerospace, and Defense testing.

  • A 360-degree view from our best-selling authors
  • Topics include the Technology of Test and Measurement, Measurement System Types, and Instrumentation for Test and Measurement
  • The ultimate hard-working desk reference; all the essential information, techniques and tricks of the trade in one volume
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Specificații

ISBN-13: 9781856175302
ISBN-10: 1856175308
Pagini: 912
Ilustrații: Approx. 560 illustrations
Dimensiuni: 191 x 235 x 51 mm
Greutate: 1.88 kg
Editura: ELSEVIER SCIENCE
Seria Newnes Know It All


Public țintă

Field Application Engineers; Electronics Engineers; Communications Engineers

Cuprins

Chapter 1 Fundamental of measurementChapter 2 Sensors and TransducersChapter 3. Data acquisition hardware and softwareChapter 4. Overview of measurement systemsChapter 5 Acceleration, Shock and VibrationChapter 6 FlowChapter 7 TemperatureChapter 8 PressureChapter 9. PositionChapter 10 Strain gauges, loadcells and weighingChapter 11 LightChapter 12 Signal Processing and ConditioningChapter 13 Interfacing and Data CommunicationsChapter 14 Data acquisition softwareChapter 15. Scaling and calibrationChapter 16. Synthetic instrumentsChapter 17 Real-world measurement applicationsChapter 18. Testing methodsChapter 19 Boundary Scan TechniquesChapter 20 Inspection TestChapter 21 EMC fundamentalsChapter 22 Measuring RF emissionsChapter 23 Test methodsChapter 24 Test planningCHAPTER 25 Accelerated testing fundamentalsChapter 26 HALT and FMVTAppendix A: Standard Interfaces