Testing and Diagnosis of Analog Circuits and Systems
Autor Ruey-wen Liuen Limba Engleză Paperback – 8 mar 2012
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Specificații
ISBN-13: 9781461597490
ISBN-10: 1461597498
Pagini: 304
Ilustrații: XV, 284 p. 2 illus.
Dimensiuni: 152 x 229 x 16 mm
Greutate: 0.41 kg
Ediția:Softcover reprint of the original 1st ed. 1991
Editura: Springer Us
Colecția Springer
Locul publicării:New York, NY, United States
ISBN-10: 1461597498
Pagini: 304
Ilustrații: XV, 284 p. 2 illus.
Dimensiuni: 152 x 229 x 16 mm
Greutate: 0.41 kg
Ediția:Softcover reprint of the original 1st ed. 1991
Editura: Springer Us
Colecția Springer
Locul publicării:New York, NY, United States
Public țintă
ResearchCuprins
1. A Circuit Theoretic Approach to Analog Fault Diagnosis.- Background.- An Introduction to Analog Fault Diagnosis.- Important Issues of Analog Fault Diagnosis.- The Element-Value Solvability Problem.- A Fault/Tolerance Compensation Model.- k-Fault Diagnosis: The Ideal Case.- k-Fault Diagnosis: The Tolerance Case.- Illustrative Examples.- 2. Linear Method vs. Nonlinear Method.- Setting of the Problem.- Probability.- Probability Measure.- Perturbation of Parameters.- Geometry of SF and TF.- Linear Method Is as Powerful as the Nonlinear Method.- 3. Topological Testability Conditions for Analog Fault Diagnosis.- Theory.- Applications.- 4. Fault Diagnosis of Nonlinear Electronic Circuits.- Fault Diagnosis of Linear Circuits.- Fault Diagnosis of PWL Circuits.- Examples.- 5. Analog Multifrequency Fault Diagnosis with the Assumption of Limited Failures.- The CCM and the Fault Diagnosis Equations of [4].- A Motivational Example.- Diagnosability for nf Faults.- Limited Fault Algorithm.- Limited Fault Algorithm Examples.- 6. A Searching Approach Self-Testing Algorithm for Analog Fault Diagnosis.- Automatic Test Program Generation.- Decision Algorithms.- The Heuristic Algorithm.- Parallel Processing for Analog Fault Diagnosis.- Design for Testability.- 7. An Artificial Intelligence Approach to Analog Systems Diagnosis.- Qualitative Causal Models.- The Treatment of Fault Probabilities.- Best Test Strategies.- FIS: An Implemented Diagnostic System.- Current Applications of FIS.- 8. Automatic Testing for Control Systems Conformance.- Historical Development of ATE.- Transfer Function Testing.- Return Signal Processing.- Tuning of Large Electro-Mechanical Servosystems.- The SUT Test Signature.- Transfer Function Models of Control Systems.- The “Fuzzy” Nature of Control SystemBehavior.- Checkout Based on Quadratic Performance Criteria.- “Closed Loop” Testing.- 9. Testing of Analog Integrated Circuits.- Testing vs. Diagnosis.- Digital vs. Analog Testing.- Specification-Based Testing.- Solution of the Test Tolerance Assignment Problem.- Consideration for Fault-Model-Based Testing.- An Approach to Fault-Model-Based Testing.- 10. A Unified Theory on Test Generation for Analog/Digital Systems.- Notation and Basic Concepts.- Testability of Interconnected Systems.- Reachability, Observability, and Testability.- Test Generation for Interconnected Systems: Case Studies.