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Testing of ASIC and FPGA circuits

Autor Raj Sumit
en Limba Engleză Paperback – 29 oct 2012
This is my first book, related to my masters thesis work. In this book I have mentioned my research work on faster approach towards testing of VLSI design. This book is not limited to only my approach in testing, but whole ASIC and FPGA testing methods are given in brief. So this book can be used for general study related to VLSI testing. I hope this book enhance your knowledge in VLSI testing field.
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Specificații

ISBN-13: 9783659275852
ISBN-10: 3659275859
Pagini: 160
Dimensiuni: 152 x 229 x 9 mm
Greutate: 0.25 kg
Editura: LAP LAMBERT ACADEMIC PUBLISHING AG & CO KG
Colecția LAP Lambert Academic Publishing