The Impact of Coincidence in Modern American, British, and Asian History
Autor Bruce a. Ellemanen Limba Engleză Paperback – 10 oct 2023
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Specificații
ISBN-13: 9781839989605
ISBN-10: 1839989602
Pagini: 112
Dimensiuni: 152 x 229 x 6 mm
Greutate: 0.18 kg
Editura: Anthem Press
ISBN-10: 1839989602
Pagini: 112
Dimensiuni: 152 x 229 x 6 mm
Greutate: 0.18 kg
Editura: Anthem Press
Notă biografică
Bruce A. Elleman received his BA from UC Berkeley in 1982, his MA in 1984, a master of philosophy degree in 1987, an East Asian Certificate in 1988, and his Ph.D. in 1993 at Columbia University. In addition, he completed a master of sciences degree at the London School of Economics in 1985, and a master of arts in national security and strategic studies (with distinction) at the Naval War College, Newport, Rhode Island, in 2004.