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The Rietveld Method: International Union of Crystallography Monographs on Crystallography, cartea 5

R. a. Young
en Limba Engleză Paperback – 19 ian 1995
The Rietveld method is a powerful and relatively new method for extracting detailed crystal structural information from X-ray and neutron powder diffraction data. Since such structural details dictate much of the physical and chemical attributes of materials, knowledge of them is crucial to our understanding of those properties and our ability to manipulate them. Since most materials of technological interest are not available as single crystals but often are available only in polycrystalline or powder form, the Rietveld method has become very important and is now widely used in all branches of science that deal with materials at the atomic level. This book, a collaboration by many authorities in the field, has tutorial and advisory value for those who already have some experience with this important method, but an introductory chapter enables the book to be used as a first text for researchers starting in this area of science.
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Specificații

ISBN-13: 9780198559122
ISBN-10: 0198559127
Pagini: 308
Ilustrații: line drawings, tables
Dimensiuni: 156 x 234 x 18 mm
Greutate: 0.46 kg
Ediția:Revised
Editura: OUP International Union of Crystallography
Colecția OUP Oxford
Seria International Union of Crystallography Monographs on Crystallography

Locul publicării:Oxford, United Kingdom

Cuprins

R.A. Young: Introduction to the Rietveld Method; H.M. Rietveld: The early days: a retrospective view; E. Prince: Mathematical aspects of Rietveld refinement; T.M. Sabine: The flow of radiation in a polycrystalline material; R.J. Hill: Data collection strategies: fitting the experiment to the need; J.W. Richardson jr: Background modelling in Rietveld analysis; R.L. Snyder: Analytical profile fitting of X-ray powder diffraction profiles in Rietveld analysis; R. Delhez, Th. H. de Keijser, J.I. Langford, D. Louër, E.J. Mittemeijer, and E.J. Sonneveld: Crystal imperfection broadening and peak shape in the Rietveld method; P. Suortti: Bragg reflection profile shape in X-ray powder diffraction patterns; C. Bärlocher: Restraints and constraints in Rietveld refinement; W.I.F. David, & J.D. Jorgensen: Rietveld refinement with time-of-flight powder diffraction from pulsed neutron sources; R.B. von Dreele: Combined X-ray and neutron Rietveld refinement; F. Izumi: Rietveld analysis programs Rietan and Premos and special applications; H. Toraya: Position-constrained and unconstrained powder-pattern-decomposition methods; A.K. Cheetham: Ab initio structure solutions with powder diffraction data.

Recenzii

essential reading for any individual who is interested in using the Rietweld method in materials analysis