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Thermal Conductivity Measurements in Atomically Thin Materials and Devices: SpringerBriefs in Applied Sciences and Technology

Autor T. Serkan Kasirga
en Limba Engleză Paperback – 20 mai 2020
This book assesses the thermal feasibility of using materials with atomically thin layers such as graphene and the transition metal dichalcogenides family in electronics and optoelectronics applications. The focus is on thermal conductivity measurement techniques currently available for the investigation of thermal performance at the material and device level. In addition to providing detailed information on the available techniques, the book introduces readers to novel techniques based on photothermal effects. 
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Specificații

ISBN-13: 9789811553479
ISBN-10: 9811553475
Pagini: 50
Ilustrații: XV, 50 p. 24 illus., 21 illus. in color.
Dimensiuni: 155 x 235 mm
Greutate: 0.11 kg
Ediția:1st ed. 2020
Editura: Springer Nature Singapore
Colecția Springer
Seriile SpringerBriefs in Applied Sciences and Technology, Nanoscience and Nanotechnology

Locul publicării:Singapore, Singapore

Cuprins

Introduction.- Importance of thermal management in modern applications.- Thermal properties of atomically thin materials and devices.- Thermal conductivity measurement methods for nanosheets.- Steady-state measurement methods.- Transient measurement methods.- Use of photothermal effects as a novel thermal conductivity measurement method.- Outlook.

Notă biografică

Dr. Kasırga completed his Ph.D. in December 2013 and right after moved to Bilkent University as an Assistant Prof. Since 2015 he has been serving as associate director of the National Nanotechnology Research Center at Bilkent University. His research interests are in the area of strongly correlated systems and 2D materials.

Caracteristici

Highlights the use of materials with atomically thin layers in electronics and optoelectronic devices Discusses the thermal performance of materials such as graphene and transition metal dichalcogenides Introduces readers to novel techniques for thermal measurement based on the photothermal effects