Transport Simulation in Microelectronics: Progress in Numerical Simulation for Microelectronics, cartea 3
Autor Alfred Kersch, William J. Morokoffen Limba Engleză Paperback – 28 sep 2011
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Specificații
ISBN-13: 9783034898980
ISBN-10: 3034898983
Pagini: 244
Ilustrații: 240 p.
Dimensiuni: 152 x 229 x 13 mm
Greutate: 0.34 kg
Ediția:Softcover reprint of the original 1st ed. 1995
Editura: Birkhäuser Basel
Colecția Birkhäuser
Seria Progress in Numerical Simulation for Microelectronics
Locul publicării:Basel, Switzerland
ISBN-10: 3034898983
Pagini: 244
Ilustrații: 240 p.
Dimensiuni: 152 x 229 x 13 mm
Greutate: 0.34 kg
Ediția:Softcover reprint of the original 1st ed. 1995
Editura: Birkhäuser Basel
Colecția Birkhäuser
Seria Progress in Numerical Simulation for Microelectronics
Locul publicării:Basel, Switzerland
Public țintă
Popular/generalCuprins
Content.- 1 The Boltzmann Equation.- 1.1 The Liouville Equation.- 1.2 Rarefied Gases.- 1.3 Radiation Transport.- 1.4 Electron Transport.- 1.5 Summary.- 2 Modeling of Gas Flow.- 2.1 Typical Reactors.- 2.2 Hydrodynamic Equations.- 2.3 Near Hydrodynamic Flows.- 2.4 Transition Regime Flows.- 2.5 Free Molecular Flow.- 3 Numerical Methods for Rarefied Gas Dynamics.- 3.1 Direct Simulation Monte Carlo.- 3.2 Computing Results.- 3.3 Extensions.- 3.4 Simplified Flows.- 4 Gas Transport Simulations.- 4.1 Near Hydrodynamic Effects.- 4.2 UHV-CVD Reactor.- 4.3 Sputtering Reactors.- 5 Modeling of Radiative Heat Transfer.- 5.1 Rapid Thermal Processing.- 5.2 Semi-transparent Materials.- 5.3 Optical Properties of Surfaces.- 5.4 Solution of the Integral Equation.- 5.5 The Rendering Equation.- 6 Monte Carlo for Radiation Transport.- 6.1 Monte Carlo Solution Procedure.- 6.2 Quasi-Monte Carlo Methods.- 6.3 Coupling Radiation and Gas Transport.- 7 Radiation Transport Simulations.- 7.1 Case Study of an RTP Reactor.- 7.2 Scalar Control RTCVD-reactor.- 7.3 Multi-variable Control RTCVD-reactor.- 8 Modeling of Charge Transport.- 8.1 Numerical Methods for Linear Transport.- 8.2 Further Comparisons.- A Monte Carlo Methods.- References.