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Trap Level Spectroscopy in Amorphous Semiconductors

Autor Victor V. Mikla, Victor I. Mikla
en Limba Engleză Paperback – 13 iun 2010
Although amorphous semiconductors have been studied for over four decades, many of their properties are not fully understood. This book discusses not only the most common spectroscopic techniques but also describes their advantages and disadvantages.

  • Provides information on the most used spectroscopic techniques
  • Discusses the advantages and disadvantages of each technique
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Specificații

ISBN-13: 9780323165037
ISBN-10: 0323165036
Pagini: 128
Dimensiuni: 152 x 229 x 7 mm
Greutate: 0.18 kg
Editura: ELSEVIER SCIENCE

Public țintă

Researchers and postgraduate students in materials science and solid state physics.

Cuprins

  1. Introduction
  2. Thermally stimulated depolarization currents in amorphous chalcogenides
  3. Carrier transport processes in amorphous solids
  4. Time-of-flight experiments in amorphous chalcogenide semiconductors
  5. Xerographic spectroscopy of states in mobility gap
  6. Photoinduced effects on states in the mobility gap
  7. Spectroscopic studies of gap states and laser-induced structural transformations in se-based as-free amorphous semiconductors