Trap Level Spectroscopy in Amorphous Semiconductors
Autor Victor V. Mikla, Victor I. Miklaen Limba Engleză Paperback – 13 iun 2010
- Provides information on the most used spectroscopic techniques
- Discusses the advantages and disadvantages of each technique
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Specificații
ISBN-13: 9780323165037
ISBN-10: 0323165036
Pagini: 128
Dimensiuni: 152 x 229 x 7 mm
Greutate: 0.18 kg
Editura: ELSEVIER SCIENCE
ISBN-10: 0323165036
Pagini: 128
Dimensiuni: 152 x 229 x 7 mm
Greutate: 0.18 kg
Editura: ELSEVIER SCIENCE
Public țintă
Researchers and postgraduate students in materials science and solid state physics.Cuprins
- Introduction
- Thermally stimulated depolarization currents in amorphous chalcogenides
- Carrier transport processes in amorphous solids
- Time-of-flight experiments in amorphous chalcogenide semiconductors
- Xerographic spectroscopy of states in mobility gap
- Photoinduced effects on states in the mobility gap
- Spectroscopic studies of gap states and laser-induced structural transformations in se-based as-free amorphous semiconductors