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Troubleshooting Communications Facilities: Wiley Series in Telecommunications and Signal Processing

Autor Bertil C. Lindberg, James Wetterau
en Limba Engleză Hardback – 28 iun 2015
The Second Edition of this handy and accessible guide has been greatly updated to encompass the many changes that have taken place in telecommunications, including the various forms of digital networks and their testing aspects.

Troubleshooting Communications Facilities comprehensively covers all aspects of measurements and tests on data and telecommunications circuits, with an emphasis on practical troubleshooting of operating systems. It describes the correct analysis of frame errors, CRC errors, pattern, and other logic errors. The text also contains a greatly expanded fiber optic section that includes discussion of SONET line and section and path performance monitoring. Discussion of optical–loss test sets is also included, as is the use of Maximum Time Interval Error and Time Deviation of jitter and wander measurements are discussed. A new appendix covers buyers′ guide type information on vendors and test measuring equipment, including vendor addresses, telephone numbers, email addresses, and Web site URLs. The text provides correlation between test procedures and types of test and measuring equipment to be used. ATM and MPLS are discussed as well. This book is an invaluable guide for technical professionals in the telecommunications industry.
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Specificații

ISBN-13: 9780471430865
ISBN-10: 0471430862
Pagini: 400
Dimensiuni: 150 x 250 mm
Ediția:2nd Edition
Editura: John Wiley and Sons Ltd
Colecția Wiley–Blackwell
Seria Wiley Series in Telecommunications and Signal Processing

Locul publicării:Hoboken, United States

Public țintă

Test engineers and technicians business managers and technical libraries

Descriere

  • Updated  Second Edition of the handy and accessible guide
  • Greatly updated to encompass the many changes that have taken place in telecommunications, including the various forms of digital networks and their testing aspects.