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VLSI Test Principles and Architectures: Design for Testability

Autor Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wen
en Limba Engleză Paperback – 30 iun 2006
This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume.
. Most up-to-date coverage of design for testability.
. Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books.
. Numerous, practical examples in each chapter illustrating basic VLSI test principles and DFT architectures.
. Lecture slides and exercise solutions for all chapters are now available.
. Instructors are also eligible for downloading PPT slide files and MSWORD solutions files from the manual website."
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Specificații

ISBN-13: 9781493300860
ISBN-10: 1493300865
Pagini: 808
Ediția:
Editura: Morgan Kaufmann Publishers