VLSI Test Principles and Architectures: Design for Testability
Autor Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wenen Limba Engleză Paperback – 30 iun 2006
. Most up-to-date coverage of design for testability.
. Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books.
. Numerous, practical examples in each chapter illustrating basic VLSI test principles and DFT architectures.
. Lecture slides and exercise solutions for all chapters are now available.
. Instructors are also eligible for downloading PPT slide files and MSWORD solutions files from the manual website."
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