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Wafer-Level Testing and Test During Burn-In for Integrated Circuits: Artech House Integrated Microsystems

Autor Sudarshan Bahukudumbi, Krishnendu Chakrabarty
en Limba Engleză Hardback – 31 ian 2010
This hands-on resource provides a comprehensive analysis of these methods, showing how wafer-level testing during burn-in WLTBI helps lower product cost in semiconductor manufacturing. Engineers learn how to implement the testing of integrated circuits at the wafer-level under various resource constraints. Moreover, this unique book helps practitioners address the issue of enabling next generation products with previous generation testers. Practitioners also find expert insights on current industry trends in WLTBI test solutions. International direct mail promotion
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Specificații

ISBN-13: 9781596939899
ISBN-10: 1596939893
Pagini: 198
Dimensiuni: 157 x 231 x 18 mm
Greutate: 0.43 kg
Editura: Artech House Publishers
Seria Artech House Integrated Microsystems