Cărți de Wojciech Maly

VLSI Design for Manufacturing: Yield Enhancement

The Springer International Series in Engineering and Computer Science, nr. 86

Autor Stephen W. Director et al.

30 noi 1989

Preț: 923^.84 lei 1126^.64 lei

6-8 săpt.

-18%

From Contamination to Defects, Faults and Yield Loss: Simulation and Applications

Frontiers in Electronic Testing, nr. 5

Autor Jitendra B. Khare et al.

30 apr 1996

Preț: 622^.04 lei 731^.82 lei

6-8 săpt.

-15%