X-Ray Diffraction
Editat de Kaimin Shihen Limba Engleză Hardback – 31 aug 2013
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Specificații
ISBN-13: 9781628085914
ISBN-10: 1628085916
Pagini: 248
Ilustrații: illustrations
Dimensiuni: 182 x 258 x 21 mm
Greutate: 0.69 kg
Editura: Nova Science Publishers Inc
ISBN-10: 1628085916
Pagini: 248
Ilustrații: illustrations
Dimensiuni: 182 x 258 x 21 mm
Greutate: 0.69 kg
Editura: Nova Science Publishers Inc
Cuprins
Preface; Development & Application of X-Ray Diffraction Technique for Single Crystal; Structure Characterization of Coordination Polymers by X-Ray Diffraction Data; X-Ray Diffraction Analysis of Magnetic Shape Memory Alloys; Crystal Structures of New Rare Earth Intermetallic Compounds; Application of Quantitative X-Ray Diffraction in Geoenvironmental Problems: Overview & Case Studies; Quantitative X-Ray Diffraction for Revealing the Thermal Incorporation Behavior of Lead; X-Ray Analysis of Metal Oxide-Metal Core-Shell Nanoparticles; Characterization of Materials Obtained by an Innovative Integrated Synthesis Method Aimed to the Hydrogen Technology; Depth Resolved Measurement of the 3D Residual Stress State in Surface Engineered Aluminium by Synchrotron Diffraction; In-situ Nanofocused X-Ray Diffraction Combined with Scanning Probe Microscopy; Structure Solution Combining X-Ray & Electron Crystallography; Index.